ON THE THICKNESS PERIODICITY OF ATOMIC-RESOLUTION IMAGES OF DISLOCATION CORES.

John Spence, M. A. O'Keefe, S. Iijima

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

Experimental conditions needed to obtain atomic-resolution images of dislocation cores are discussed. Experimental and computer-simulated images are used to show that, to a limited but useful resolution, these images are periodic functions of the specimen thickness as a consequence of dynamical scattering. Useful images may therefore be obtained from some specimens of sufficient thickness to allow surface relaxation effects to be neglected. End-on projections of stair-rod dislocations and dislocation dipoles are suggested for further study.

Original languageEnglish (US)
Pages (from-to)463-482
Number of pages20
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume38
Issue number4
StatePublished - Oct 1978

Fingerprint

image resolution
Image resolution
periodic variations
Surface relaxation
Stairs
periodic functions
Scattering
rods
projection
dipoles
scattering

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Metals and Alloys
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

Cite this

ON THE THICKNESS PERIODICITY OF ATOMIC-RESOLUTION IMAGES OF DISLOCATION CORES. / Spence, John; O'Keefe, M. A.; Iijima, S.

In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, Vol. 38, No. 4, 10.1978, p. 463-482.

Research output: Contribution to journalArticle

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