On the thickness periodicity of atomic-resolution images of dislocation cores

John Spence, M. A. O'Keefe, S. Iijima

Research output: Contribution to journalArticle

23 Scopus citations

Abstract

Experimental conditions needed to obtain atomic-resolution images of dislocation cores are discussed. Experimental and computer-simulated images are used to show that, to a limited but useful resolution, these images are periodic functions of the specimen thickness as a consequence of dynamical scattering. Useful images may therefore be obtained from some specimens of sufficient thickness to allow surface relaxation effects to be neglected. End-on projections of stair-rod dislocations and dislocation dipoles are suggested for further study.

Original languageEnglish (US)
Pages (from-to)463-482
Number of pages20
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume38
Issue number4
DOIs
StatePublished - Oct 1978

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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