On the measurement of thickness in nanoporous materials by EELS

Nan Jiang, Dong Su, John Spence

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Fingerprint

Dive into the research topics of 'On the measurement of thickness in nanoporous materials by EELS'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds