On the measurement of thickness in nanoporous materials by EELS

Nan Jiang, Dong Su, John Spence

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

This work discusses thickness measurements in nanoporous MgO using the log-ratio method in electron energy-loss spectroscopy (EELS). In heterogeneous nanoporous systems, the method can induce large errors if the strength of excitations at interfaces between pores and the matrix is large. In homogeneous nanoporous systems, on the other hand, the log-ratio method is still valid, but the inelastic scattering mean-free-path is no longer equal to that in the same bulk system.

Original languageEnglish (US)
Pages (from-to)62-65
Number of pages4
JournalUltramicroscopy
Volume111
Issue number1
DOIs
StatePublished - Dec 2010

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Inelastic scattering
Thickness measurement
Electron energy loss spectroscopy
mean free path
inelastic scattering
energy dissipation
electron energy
porosity
matrices
spectroscopy
excitation

Keywords

  • EELS
  • Nanoporous
  • Thickness

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

Cite this

On the measurement of thickness in nanoporous materials by EELS. / Jiang, Nan; Su, Dong; Spence, John.

In: Ultramicroscopy, Vol. 111, No. 1, 12.2010, p. 62-65.

Research output: Contribution to journalArticle

Jiang, Nan ; Su, Dong ; Spence, John. / On the measurement of thickness in nanoporous materials by EELS. In: Ultramicroscopy. 2010 ; Vol. 111, No. 1. pp. 62-65.
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