On the mean inner potential in high- and low-energy electron diffraction

D. K. Saldin, John Spence

Research output: Contribution to journalArticle

50 Citations (Scopus)

Abstract

New electron microscopies spanning the energy range from millivolts to kilovolts image different beam-energy-dependent potentials. We review the theories of the average value of the mean inner potential of a solid in order to understand its role in image interpretation and its relationship to charge density and atom positions in crystals. Three common definitions of this quantity are compared, that from high-volatge transmission electron interferometry, the theory of surface dipole layers and the work function, and that from low-energy electron diffraction (LEED). Energy-dependent corrections due to exchange and virtual inelastic scattering are proposed for LEED, photoelectron holography (PEH), the low-energy electron microscope (LEEM) and the point-projection microscope (PPM) operating in the sub-kilovolt range. A calculation of the mean free path of low-energy electrons as a function of their energy is also reproduced.

Original languageEnglish (US)
Pages (from-to)397-406
Number of pages10
JournalUltramicroscopy
Volume55
Issue number4
DOIs
StatePublished - 1994

Fingerprint

Low energy electron diffraction
electron diffraction
Inelastic scattering
Electrons
Holography
Photoelectrons
Charge density
Interferometry
Electron microscopy
Microscopes
Electron microscopes
Atoms
Crystals
energy
mean free path
holography
electron microscopy
interferometry
inelastic scattering
photoelectrons

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

On the mean inner potential in high- and low-energy electron diffraction. / Saldin, D. K.; Spence, John.

In: Ultramicroscopy, Vol. 55, No. 4, 1994, p. 397-406.

Research output: Contribution to journalArticle

@article{dd4e220eae7f4d8da77b4d33bc332217,
title = "On the mean inner potential in high- and low-energy electron diffraction",
abstract = "New electron microscopies spanning the energy range from millivolts to kilovolts image different beam-energy-dependent potentials. We review the theories of the average value of the mean inner potential of a solid in order to understand its role in image interpretation and its relationship to charge density and atom positions in crystals. Three common definitions of this quantity are compared, that from high-volatge transmission electron interferometry, the theory of surface dipole layers and the work function, and that from low-energy electron diffraction (LEED). Energy-dependent corrections due to exchange and virtual inelastic scattering are proposed for LEED, photoelectron holography (PEH), the low-energy electron microscope (LEEM) and the point-projection microscope (PPM) operating in the sub-kilovolt range. A calculation of the mean free path of low-energy electrons as a function of their energy is also reproduced.",
author = "Saldin, {D. K.} and John Spence",
year = "1994",
doi = "10.1016/0304-3991(94)90175-9",
language = "English (US)",
volume = "55",
pages = "397--406",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "4",

}

TY - JOUR

T1 - On the mean inner potential in high- and low-energy electron diffraction

AU - Saldin, D. K.

AU - Spence, John

PY - 1994

Y1 - 1994

N2 - New electron microscopies spanning the energy range from millivolts to kilovolts image different beam-energy-dependent potentials. We review the theories of the average value of the mean inner potential of a solid in order to understand its role in image interpretation and its relationship to charge density and atom positions in crystals. Three common definitions of this quantity are compared, that from high-volatge transmission electron interferometry, the theory of surface dipole layers and the work function, and that from low-energy electron diffraction (LEED). Energy-dependent corrections due to exchange and virtual inelastic scattering are proposed for LEED, photoelectron holography (PEH), the low-energy electron microscope (LEEM) and the point-projection microscope (PPM) operating in the sub-kilovolt range. A calculation of the mean free path of low-energy electrons as a function of their energy is also reproduced.

AB - New electron microscopies spanning the energy range from millivolts to kilovolts image different beam-energy-dependent potentials. We review the theories of the average value of the mean inner potential of a solid in order to understand its role in image interpretation and its relationship to charge density and atom positions in crystals. Three common definitions of this quantity are compared, that from high-volatge transmission electron interferometry, the theory of surface dipole layers and the work function, and that from low-energy electron diffraction (LEED). Energy-dependent corrections due to exchange and virtual inelastic scattering are proposed for LEED, photoelectron holography (PEH), the low-energy electron microscope (LEEM) and the point-projection microscope (PPM) operating in the sub-kilovolt range. A calculation of the mean free path of low-energy electrons as a function of their energy is also reproduced.

UR - http://www.scopus.com/inward/record.url?scp=0028519005&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028519005&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(94)90175-9

DO - 10.1016/0304-3991(94)90175-9

M3 - Article

AN - SCOPUS:0028519005

VL - 55

SP - 397

EP - 406

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 4

ER -