Abstract
Next generation aberration correctors will not only eliminate the third-order spherical aberration, but also improve the information limit by correction of chromatic aberration. As a result of these improvements, higher order aberrations, which have largely been neglected in image analysis, will become important. In this paper, we concern ourselves with situations where sub-Å resolution can be achieved, and where the third-order spherical aberration is corrected and the fifth-order spherical aberration is measurable. We derive formulae to explore the maximum value of the fifth-order spherical aberration for directly interpretable imaging and discuss the optimum imaging conditions and their applicable range.
Original language | English (US) |
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Pages (from-to) | 301-306 |
Number of pages | 6 |
Journal | Ultramicroscopy |
Volume | 106 |
Issue number | 4-5 |
DOIs | |
State | Published - Mar 2006 |
Externally published | Yes |
Keywords
- C and C-corrected microscope
- Phase contrast theory
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation