On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

John Spence; J. M. Zuo; J. Lynch

doi:10.1016/0304-3991(89)90218-0

On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

John Spence, J. M. Zuo, J. Lynch

Physics

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.

Original language	English (US)
Pages (from-to)	233-239
Number of pages	7
Journal	Ultramicroscopy
Volume	31
Issue number	2
DOIs	https://doi.org/10.1016/0304-3991(89)90218-0
State	Published - Oct 1989

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(89)90218-0

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title = "On the Holz contribution to stem lattice images formed using high-angle dark-field detectors",

abstract = "An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.",

author = "John Spence and Zuo, {J. M.} and J. Lynch",

note = "Funding Information: This work was supported by NSF grant No. DMR8813879 and the facilities of the ASU-NSF facility for HREM at ASU.",

year = "1989",

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doi = "10.1016/0304-3991(89)90218-0",

language = "English (US)",

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AU - Spence, John

AU - Zuo, J. M.

AU - Lynch, J.

N1 - Funding Information: This work was supported by NSF grant No. DMR8813879 and the facilities of the ASU-NSF facility for HREM at ASU.

PY - 1989/10

Y1 - 1989/10

N2 - An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.

AB - An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.

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JO - Ultramicroscopy

JF - Ultramicroscopy

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ER -

On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

Abstract

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