On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

John Spence, J. M. Zuo, J. Lynch

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.

Original languageEnglish (US)
Pages (from-to)233-240
Number of pages8
JournalUltramicroscopy
Volume31
Issue number2
DOIs
StatePublished - 1989

Fingerprint

Silicon
stems
Electron diffraction
Diffraction patterns
Detectors
Electrons
detectors
diffraction patterns
electron diffraction
interference
silicon
electrons

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

On the Holz contribution to stem lattice images formed using high-angle dark-field detectors. / Spence, John; Zuo, J. M.; Lynch, J.

In: Ultramicroscopy, Vol. 31, No. 2, 1989, p. 233-240.

Research output: Contribution to journalArticle

@article{35a996d482ff46d4a58037b0fa1ad5f4,
title = "On the Holz contribution to stem lattice images formed using high-angle dark-field detectors",
abstract = "An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.",
author = "John Spence and Zuo, {J. M.} and J. Lynch",
year = "1989",
doi = "10.1016/0304-3991(89)90218-0",
language = "English (US)",
volume = "31",
pages = "233--240",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "2",

}

TY - JOUR

T1 - On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

AU - Spence, John

AU - Zuo, J. M.

AU - Lynch, J.

PY - 1989

Y1 - 1989

N2 - An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.

AB - An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.

UR - http://www.scopus.com/inward/record.url?scp=0024746653&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024746653&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(89)90218-0

DO - 10.1016/0304-3991(89)90218-0

M3 - Article

AN - SCOPUS:0024746653

VL - 31

SP - 233

EP - 240

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 2

ER -