On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

John Spence, J. M. Zuo, J. Lynch

Research output: Contribution to journalArticle

24 Scopus citations

Abstract

An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.

Original languageEnglish (US)
Pages (from-to)233-239
Number of pages7
JournalUltramicroscopy
Volume31
Issue number2
DOIs
StatePublished - Oct 1989

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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