On the design of easily testable sequential machines

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Citations (Scopus)

Abstract

In order to obtain a short fault- detection sequence for a sequential machine, the concept of an easily testable machine is introduced. Such a machine is one which possesses a minimal- length homogeneous distinguishing sequence and requires no transfer sequences in the faultdetection sequence. A design procedure is presented in which an arbitrary machine is embedded in an easily testable machine by adding input lines to the original machine. The procedure also derives a fault- detection sequence for the easily testable machine.

Original languageEnglish (US)
Title of host publicationUnknown Host Publication Title
Pages38-42
Number of pages5
StatePublished - 1971
Externally publishedYes
EventIEEE Conf Rec 1971 12th annu symp on switching & automata theory - East Lansing, Mich
Duration: Oct 13 1971Oct 15 1971

Other

OtherIEEE Conf Rec 1971 12th annu symp on switching & automata theory
CityEast Lansing, Mich
Period10/13/7110/15/71

Fingerprint

Sequential machines
Fault detection

ASJC Scopus subject areas

  • Engineering(all)

Cite this

KANE, & Yau, S-S. (1971). On the design of easily testable sequential machines. In Unknown Host Publication Title (pp. 38-42)

On the design of easily testable sequential machines. / KANE, ; Yau, Sik-Sang.

Unknown Host Publication Title. 1971. p. 38-42.

Research output: Chapter in Book/Report/Conference proceedingChapter

KANE, & Yau, S-S 1971, On the design of easily testable sequential machines. in Unknown Host Publication Title. pp. 38-42, IEEE Conf Rec 1971 12th annu symp on switching & automata theory, East Lansing, Mich, 10/13/71.
KANE , Yau S-S. On the design of easily testable sequential machines. In Unknown Host Publication Title. 1971. p. 38-42
KANE, ; Yau, Sik-Sang. / On the design of easily testable sequential machines. Unknown Host Publication Title. 1971. pp. 38-42
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