On the coiflet-TDS solution for scattering by sharp coated cones and its application to emissivity determination

Ming Jin, Ming Bai, Lisha Zhang, George Pan, Jungang Miao

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

We report the continuous effects in modeling sharp coated cones as calibration targets by surface integration solutions. The Coiflet based method of moment (MoM) is employed in conjunction with the thin dielectric sheet approximation (TDS). The Coifman wavelets inherit mathematical superiority in the Galerkin procedure, e.g., the high precision one-point quadrature for fast matrix filling, local multi-resolution ability, and high regularity with Hölder index 1.449 in smoothness. Local geometry refinements are implemented to reduce the errors by TDS approximation in modeling very sharp structures. The Coiflet-TDS solution is compared to an in-house FDTD package and good agreement has been observed. The presented MoM is also compared against the RWG-TDS based commercial software FEKO, and the Coiflet-TDS demonstrates more robust in modeling surfaces with sharp geometries. Finally, the emissivity of a calibrator is studied versus directions and polarizations, and its variation trends are observed.

Original languageEnglish (US)
Article number7295592
Pages (from-to)1399-1409
Number of pages11
JournalIEEE Transactions on Geoscience and Remote Sensing
Volume54
Issue number3
DOIs
StatePublished - Mar 1 2016

Keywords

  • Calibration target
  • Coifman wavelets
  • Emissivity
  • Microwave radiometer (MWR)
  • Scattering

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Earth and Planetary Sciences(all)

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