On the bias dependence of time exponent in NBTI and CHC effects

Jyothi B. Velamala, Vijay Reddy, Rui Zheng, Srikanth Krishnan, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

NBTI and CHC are two leading reliability concerns. Their degradation rate, which is represented by the time exponent (n), varies with multiple factors, such as the measurement method and bias voltages (i.e., different n for sub-threshold or linear current). Such a variation significantly affects the long-term prediction of circuit lifetime. By investigating the underlying mechanisms and silicon data, we conclude that the bias dependence is due to intrinsic device non-linearity. With a unified aging model of threshold voltage (Vth) shift, different time exponents in different operation regions are consistently explained. The proposed solution captures the change of n under various supply voltages (Vdd), as validated with silicon data from transistors and RO measurement. It helps improve the accuracy in reliability prediction, reducing unnecessary design margins. Based on the result, the device and circuit lifetime is expected to be enhanced operating at lower V dd due to the reduction in the time exponent.

Original languageEnglish (US)
Title of host publication2010 IEEE International Reliability Physics Symposium, IRPS 2010
Pages650-654
Number of pages5
DOIs
StatePublished - Oct 20 2010
Event2010 IEEE International Reliability Physics Symposium, IRPS 2010 - Garden Grove, CA, Canada
Duration: May 2 2010May 6 2010

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other2010 IEEE International Reliability Physics Symposium, IRPS 2010
CountryCanada
CityGarden Grove, CA
Period5/2/105/6/10

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Keywords

  • CHC
  • NBTI
  • Reaction-diffusion
  • Temporal degradation
  • Time exponent

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Velamala, J. B., Reddy, V., Zheng, R., Krishnan, S., & Cao, Y. (2010). On the bias dependence of time exponent in NBTI and CHC effects. In 2010 IEEE International Reliability Physics Symposium, IRPS 2010 (pp. 650-654). [5488754] (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2010.5488754