On the accuracy of Perfectly Matched Layers using a finite element formulation

Michael R. Lyons, Anastasis C. Polycarpou, Constantine Balanis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A Perfectly Matched Layer (PML) is applied to a three-dimensional edge-based finite element formulation to calculate the S-parameters of waveguide structures. The PML region is implemented in the finite element code as a non-physical uniaxial anisotropic lossy material. Numerical results demonstrate the accuracy and future potential of such an absorber.

Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherIEEE
Pages205-208
Number of pages4
Volume1
Publication statusPublished - 1996
EventProceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest. Part 1 (of 3) - San Franscisco, CA, USA
Duration: Jun 17 1996Jun 21 1996

Other

OtherProceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest. Part 1 (of 3)
CitySan Franscisco, CA, USA
Period6/17/966/21/96

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Lyons, M. R., Polycarpou, A. C., & Balanis, C. (1996). On the accuracy of Perfectly Matched Layers using a finite element formulation. In IEEE MTT-S International Microwave Symposium Digest (Vol. 1, pp. 205-208). IEEE.