ON SYSTEM DIAGNOSIS WITH MULTIVALUED TEST OUTCOMES.

A. Sen Gupta, A. Sen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations
Original languageEnglish (US)
Title of host publicationProceedings of The International Symposium on Multiple-Valued Logic
PublisherIEEE
Pages356-360
Number of pages5
ISBN (Print)0818600160
StatePublished - Jan 1 1983

Publication series

NameProceedings of The International Symposium on Multiple-Valued Logic
ISSN (Print)0195-623X

ASJC Scopus subject areas

  • Computer Science(all)
  • Mathematics(all)

Cite this

Gupta, A. S., & Sen, A. (1983). ON SYSTEM DIAGNOSIS WITH MULTIVALUED TEST OUTCOMES. In Proceedings of The International Symposium on Multiple-Valued Logic (pp. 356-360). (Proceedings of The International Symposium on Multiple-Valued Logic). IEEE.