ON SYSTEM DIAGNOSIS WITH MULTIVALUED TEST OUTCOMES.

A. Sen Gupta, A. Sen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings of The International Symposium on Multiple-Valued Logic
Publisher	IEEE
Pages	356-360
Number of pages	5
ISBN (Print)	0818600160
State	Published - Jan 1 1983
Externally published	Yes

Name	Proceedings of The International Symposium on Multiple-Valued Logic
ISSN (Print)	0195-623X

ASJC Scopus subject areas

@inproceedings{42174ce379e34f12aa27654dcb6dcb54,

title = "ON SYSTEM DIAGNOSIS WITH MULTIVALUED TEST OUTCOMES.",

author = "Gupta, {A. Sen} and A. Sen",

year = "1983",

month = jan,

day = "1",

language = "English (US)",

isbn = "0818600160",

series = "Proceedings of The International Symposium on Multiple-Valued Logic",

publisher = "IEEE",

pages = "356--360",

booktitle = "Proceedings of The International Symposium on Multiple-Valued Logic",

}

TY - GEN

T1 - ON SYSTEM DIAGNOSIS WITH MULTIVALUED TEST OUTCOMES.

AU - Gupta, A. Sen

AU - Sen, A.

PY - 1983/1/1

Y1 - 1983/1/1

UR - http://www.scopus.com/inward/record.url?scp=0020543609&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020543609&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0020543609

SN - 0818600160

T3 - Proceedings of The International Symposium on Multiple-Valued Logic

SP - 356

EP - 360

BT - Proceedings of The International Symposium on Multiple-Valued Logic

PB - IEEE

ER -