On-chip switching for DC parametric testing

A. J. Walton; J. M. Robertson; R. Holwill; B. Moore

doi:10.1049/el:19850300

On-chip switching for DC parametric testing

A. J. Walton, J. M. Robertson, R. Holwill, B. Moore

Arizona State University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The concept of on-chip switching for parametric testing of semiconductor processing is introduced. The feasibility of this approach is demonstrated for contact chain and diode-connected MOSFETs.

Original language	English (US)
Pages (from-to)	422-423
Number of pages	2
Journal	Electronics Letters
Volume	21
Issue number	10
DOIs	https://doi.org/10.1049/el:19850300
State	Published - May 9 1985

Keywords

Integrated circuits
Semiconductor devices and materials
Semiconductor switches

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1049/el:19850300

Cite this

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title = "On-chip switching for DC parametric testing",

abstract = "The concept of on-chip switching for parametric testing of semiconductor processing is introduced. The feasibility of this approach is demonstrated for contact chain and diode-connected MOSFETs.",

keywords = "Integrated circuits, Semiconductor devices and materials, Semiconductor switches",

author = "Walton, {A. J.} and Robertson, {J. M.} and R. Holwill and B. Moore",

year = "1985",

month = may,

day = "9",

doi = "10.1049/el:19850300",

language = "English (US)",

volume = "21",

pages = "422--423",

journal = "Electronics Letters",

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T1 - On-chip switching for DC parametric testing

AU - Walton, A. J.

AU - Robertson, J. M.

AU - Holwill, R.

AU - Moore, B.

PY - 1985/5/9

Y1 - 1985/5/9

N2 - The concept of on-chip switching for parametric testing of semiconductor processing is introduced. The feasibility of this approach is demonstrated for contact chain and diode-connected MOSFETs.

AB - The concept of on-chip switching for parametric testing of semiconductor processing is introduced. The feasibility of this approach is demonstrated for contact chain and diode-connected MOSFETs.

KW - Integrated circuits

KW - Semiconductor devices and materials

KW - Semiconductor switches

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U2 - 10.1049/el:19850300

DO - 10.1049/el:19850300

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JO - Electronics Letters

JF - Electronics Letters

IS - 10

ER -

On-chip switching for DC parametric testing

Abstract

Keywords

ASJC Scopus subject areas

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