ON-CHIP SWITCHING FOR DC PARAMETRIC TESTING.

A. J. Walton, J. M. Robertson, R. Holwill, B. Moore

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The concept of on-chip switching for parametric testing of semiconductor processing is introduced. The feasibility of this approach is demonstrated for contact chain and diode-connected MOSFETs.

Original languageEnglish (US)
Pages (from-to)422-423
Number of pages2
JournalElectronics Letters
Volume21
Issue number10
StatePublished - May 9 1985
Externally publishedYes

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Diodes
Semiconductor materials
Testing
Processing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Walton, A. J., Robertson, J. M., Holwill, R., & Moore, B. (1985). ON-CHIP SWITCHING FOR DC PARAMETRIC TESTING. Electronics Letters, 21(10), 422-423.

ON-CHIP SWITCHING FOR DC PARAMETRIC TESTING. / Walton, A. J.; Robertson, J. M.; Holwill, R.; Moore, B.

In: Electronics Letters, Vol. 21, No. 10, 09.05.1985, p. 422-423.

Research output: Contribution to journalArticle

Walton, AJ, Robertson, JM, Holwill, R & Moore, B 1985, 'ON-CHIP SWITCHING FOR DC PARAMETRIC TESTING.', Electronics Letters, vol. 21, no. 10, pp. 422-423.
Walton AJ, Robertson JM, Holwill R, Moore B. ON-CHIP SWITCHING FOR DC PARAMETRIC TESTING. Electronics Letters. 1985 May 9;21(10):422-423.
Walton, A. J. ; Robertson, J. M. ; Holwill, R. ; Moore, B. / ON-CHIP SWITCHING FOR DC PARAMETRIC TESTING. In: Electronics Letters. 1985 ; Vol. 21, No. 10. pp. 422-423.
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