On-chip switching for DC parametric testing

A. J. Walton, J. M. Robertson, R. Holwill, B. Moore

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The concept of on-chip switching for parametric testing of semiconductor processing is introduced. The feasibility of this approach is demonstrated for contact chain and diode-connected MOSFETs.

Original languageEnglish (US)
Pages (from-to)422-423
Number of pages2
JournalElectronics Letters
Volume21
Issue number10
DOIs
StatePublished - May 9 1985

Keywords

  • Integrated circuits
  • Semiconductor devices and materials
  • Semiconductor switches

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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