On-chip switching for DC parametric testing

A. J. Walton, J. M. Robertson, R. Holwill, B. Moore

Research output: Contribution to journalArticle

2 Scopus citations


The concept of on-chip switching for parametric testing of semiconductor processing is introduced. The feasibility of this approach is demonstrated for contact chain and diode-connected MOSFETs.

Original languageEnglish (US)
Pages (from-to)422-423
Number of pages2
JournalElectronics Letters
Issue number10
StatePublished - May 9 1985


  • Integrated circuits
  • Semiconductor devices and materials
  • Semiconductor switches

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Walton, A. J., Robertson, J. M., Holwill, R., & Moore, B. (1985). On-chip switching for DC parametric testing. Electronics Letters, 21(10), 422-423. https://doi.org/10.1049/el:19850300