On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC

Osman Emir Erol, Sule Ozev, Chandra Suresh, Rubin Parekhji, Lakshmanan Balasubramanian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A robust and scalable technique for measuring the output voltage of a band-gap reference (BGR) circuit is described. The proposed technique is based on an ADC architecture that uses a voltage controlled oscillator (VCO) for voltage to frequency conversion. During production testing, an external voltage reference is used to approximate the voltage/frequency characteristics of the VCO with 5ms test time. The proposed zoom-in ADC approach is manufactured with 0.5μm CMOS process. Measurement results indicate that 12 bits of resolution within the measurement range can be achieved with the zoom-in approach. Worst-case INL for the ADC is less than 0.25LSB (50μV).

Original languageEnglish (US)
Title of host publicationProceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1559-1562
Number of pages4
ISBN (Electronic)9783981537048
DOIs
StatePublished - Apr 22 2015
Event2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
Duration: Mar 9 2015Mar 13 2015

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2015-April
ISSN (Print)1530-1591

Other

Other2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
CountryFrance
CityGrenoble
Period3/9/153/13/15

ASJC Scopus subject areas

  • Engineering(all)

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