On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC

Osman Emir Erol, Sule Ozev, Chandra Suresh, Rubin Parekhji, Lakshmanan Balasubramanian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A robust and scalable technique for measuring the output voltage of a band-gap reference (BGR) circuit is described. The proposed technique is based on an ADC architecture that uses a voltage controlled oscillator (VCO) for voltage to frequency conversion. During production testing, an external voltage reference is used to approximate the voltage/frequency characteristics of the VCO with 5ms test time. The proposed zoom-in ADC approach is manufactured with 0.5μm CMOS process. Measurement results indicate that 12 bits of resolution within the measurement range can be achieved with the zoom-in approach. Worst-case INL for the ADC is less than 0.25LSB (50μV).

Original languageEnglish (US)
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1559-1562
Number of pages4
Volume2015-April
ISBN (Print)9783981537048
StatePublished - Apr 22 2015
Event2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
Duration: Mar 9 2015Mar 13 2015

Other

Other2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
CountryFrance
CityGrenoble
Period3/9/153/13/15

ASJC Scopus subject areas

  • Engineering(all)

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    Erol, O. E., Ozev, S., Suresh, C., Parekhji, R., & Balasubramanian, L. (2015). On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. In Proceedings -Design, Automation and Test in Europe, DATE (Vol. 2015-April, pp. 1559-1562). [7092638] Institute of Electrical and Electronics Engineers Inc..