Abstract

Covering arrays have been widely used to detect the presence of faults in large software and hardware systems. Indeed, finding failures that result from faulty interactions requires that all interactions that may cause faults be covered by a test case. However, finding the actual faults requires more, because the failures resulting from two potential sets of faults must not be the same. The combinatorial requirements on test suites to enable a tester to locate the faults are developed, and set in the context of similar combinatorial search questions. Test suites known as locating and detecting arrays to locate faults both in principle and in practice generalize covering arrays, thereby addressing combinatorial fault characterization. In common with covering arrays, these locating and detecting arrays scale logarithmically in size with the number of factors, but unlike covering arrays they support complete characterization of the interactions that underlie faults.

Original languageEnglish (US)
JournalMathematics in Computer Science
DOIs
StateAccepted/In press - Jan 1 2018

Fingerprint

Fault
Covering Array
Hardware
Interaction
Framework
Generalise
Software
Requirements

Keywords

  • Combinatorial testing
  • Compressive sensing
  • Covering array
  • Detecting array
  • Experimental design
  • Locating array

ASJC Scopus subject areas

  • Computational Mathematics
  • Computational Theory and Mathematics
  • Applied Mathematics

Cite this

@article{625e7af15dd048a6a8d0df11f5f10a76,
title = "On a Combinatorial Framework for Fault Characterization",
abstract = "Covering arrays have been widely used to detect the presence of faults in large software and hardware systems. Indeed, finding failures that result from faulty interactions requires that all interactions that may cause faults be covered by a test case. However, finding the actual faults requires more, because the failures resulting from two potential sets of faults must not be the same. The combinatorial requirements on test suites to enable a tester to locate the faults are developed, and set in the context of similar combinatorial search questions. Test suites known as locating and detecting arrays to locate faults both in principle and in practice generalize covering arrays, thereby addressing combinatorial fault characterization. In common with covering arrays, these locating and detecting arrays scale logarithmically in size with the number of factors, but unlike covering arrays they support complete characterization of the interactions that underlie faults.",
keywords = "Combinatorial testing, Compressive sensing, Covering array, Detecting array, Experimental design, Locating array",
author = "Charles Colbourn and Violet Syrotiuk",
year = "2018",
month = "1",
day = "1",
doi = "10.1007/s11786-018-0385-x",
language = "English (US)",
journal = "Mathematics in Computer Science",
issn = "1661-8270",
publisher = "Birkhauser Verlag Basel",

}

TY - JOUR

T1 - On a Combinatorial Framework for Fault Characterization

AU - Colbourn, Charles

AU - Syrotiuk, Violet

PY - 2018/1/1

Y1 - 2018/1/1

N2 - Covering arrays have been widely used to detect the presence of faults in large software and hardware systems. Indeed, finding failures that result from faulty interactions requires that all interactions that may cause faults be covered by a test case. However, finding the actual faults requires more, because the failures resulting from two potential sets of faults must not be the same. The combinatorial requirements on test suites to enable a tester to locate the faults are developed, and set in the context of similar combinatorial search questions. Test suites known as locating and detecting arrays to locate faults both in principle and in practice generalize covering arrays, thereby addressing combinatorial fault characterization. In common with covering arrays, these locating and detecting arrays scale logarithmically in size with the number of factors, but unlike covering arrays they support complete characterization of the interactions that underlie faults.

AB - Covering arrays have been widely used to detect the presence of faults in large software and hardware systems. Indeed, finding failures that result from faulty interactions requires that all interactions that may cause faults be covered by a test case. However, finding the actual faults requires more, because the failures resulting from two potential sets of faults must not be the same. The combinatorial requirements on test suites to enable a tester to locate the faults are developed, and set in the context of similar combinatorial search questions. Test suites known as locating and detecting arrays to locate faults both in principle and in practice generalize covering arrays, thereby addressing combinatorial fault characterization. In common with covering arrays, these locating and detecting arrays scale logarithmically in size with the number of factors, but unlike covering arrays they support complete characterization of the interactions that underlie faults.

KW - Combinatorial testing

KW - Compressive sensing

KW - Covering array

KW - Detecting array

KW - Experimental design

KW - Locating array

UR - http://www.scopus.com/inward/record.url?scp=85053782145&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85053782145&partnerID=8YFLogxK

U2 - 10.1007/s11786-018-0385-x

DO - 10.1007/s11786-018-0385-x

M3 - Article

JO - Mathematics in Computer Science

JF - Mathematics in Computer Science

SN - 1661-8270

ER -