OMVPE growth of CdTe-ZnTe superlattices

D. W. Kisker; P. H. Fuoss; J. J. Krajewski; P. M. Amirtharaj; S. Nakahara; J. Menendez

doi:10.1016/0022-0248(90)90718-Z

OMVPE growth of CdTe-ZnTe superlattices

D. W. Kisker, P. H. Fuoss, J. J. Krajewski, P. M. Amirtharaj, S. Nakahara, J. Menendez

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Abstract

Superlattices consisting of CdTe and ZnTe have been grown using atmospheric pressure OMVPE. Structural characterization by X-ray diffraction and transmission electron microscopy along with optical characterization using photoluminescence and photoreflectance has been completed. Exceptionally bright luminescence emission compared to the corresponding alloys is observed, indicating the excellent optical quality of these layers. Similarly, in photoreflectance, we are able to observe several confined states, confirming the presence of the superlattice. Structurally, the layers exhibit a high density of defects, presumably due to the relatively large lattice and thermal expansion mismatch between CdTe, ZnTe and the GaAs substrate.

Original language	English (US)
Pages (from-to)	210-216
Number of pages	7
Journal	Journal of Crystal Growth
Volume	86
Issue number	1-4
DOIs	https://doi.org/10.1016/0022-0248(90)90718-Z
State	Published - Jan 1 1988
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Inorganic Chemistry
Materials Chemistry

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title = "OMVPE growth of CdTe-ZnTe superlattices",

abstract = "Superlattices consisting of CdTe and ZnTe have been grown using atmospheric pressure OMVPE. Structural characterization by X-ray diffraction and transmission electron microscopy along with optical characterization using photoluminescence and photoreflectance has been completed. Exceptionally bright luminescence emission compared to the corresponding alloys is observed, indicating the excellent optical quality of these layers. Similarly, in photoreflectance, we are able to observe several confined states, confirming the presence of the superlattice. Structurally, the layers exhibit a high density of defects, presumably due to the relatively large lattice and thermal expansion mismatch between CdTe, ZnTe and the GaAs substrate.",

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doi = "10.1016/0022-0248(90)90718-Z",

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T1 - OMVPE growth of CdTe-ZnTe superlattices

AU - Kisker, D. W.

AU - Fuoss, P. H.

AU - Krajewski, J. J.

AU - Amirtharaj, P. M.

AU - Nakahara, S.

AU - Menendez, J.

PY - 1988/1/1

Y1 - 1988/1/1

N2 - Superlattices consisting of CdTe and ZnTe have been grown using atmospheric pressure OMVPE. Structural characterization by X-ray diffraction and transmission electron microscopy along with optical characterization using photoluminescence and photoreflectance has been completed. Exceptionally bright luminescence emission compared to the corresponding alloys is observed, indicating the excellent optical quality of these layers. Similarly, in photoreflectance, we are able to observe several confined states, confirming the presence of the superlattice. Structurally, the layers exhibit a high density of defects, presumably due to the relatively large lattice and thermal expansion mismatch between CdTe, ZnTe and the GaAs substrate.

AB - Superlattices consisting of CdTe and ZnTe have been grown using atmospheric pressure OMVPE. Structural characterization by X-ray diffraction and transmission electron microscopy along with optical characterization using photoluminescence and photoreflectance has been completed. Exceptionally bright luminescence emission compared to the corresponding alloys is observed, indicating the excellent optical quality of these layers. Similarly, in photoreflectance, we are able to observe several confined states, confirming the presence of the superlattice. Structurally, the layers exhibit a high density of defects, presumably due to the relatively large lattice and thermal expansion mismatch between CdTe, ZnTe and the GaAs substrate.

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OMVPE growth of CdTe-ZnTe superlattices

Abstract

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