Abstract
We demonstrate that two distinctly different in-plane epitaxial states of c-axis oriented YBa2Cu3O7-δ (YBCO) films on (100) yttria-stabilized ZrO2 (YSZ) single-crystal substrates can be produced independently, namely, YBCO [100]//YSZ [100] or YBCO [100]//YSZ [110]. Both in-plane epitaxial relationships can be modeled by matching YBCO and YSZ oxygen sublattices at the film-substrate interface. High critical current densities (Jc), ∼5×105-1×106 A/cm2 at 77 K, are achieved when ≳90 vol % of either orientation is present. Jc can be degraded nearly four orders of magnitude in films with mixed orientation.
Original language | English (US) |
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Pages (from-to) | 2168-2170 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 58 |
Issue number | 19 |
DOIs | |
State | Published - 1991 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)