OBSERVATION OF THICKNESS EXTINCTION CONTOURS WITH A POINT PROJECTION ELECTRON MICROSCOPE.

Research output: Contribution to journalArticle

Abstract

A method for observing thickness extinction contours with a point projection electron microscope is outlined which offers several advantages over normal methods using the conventional transmission electron microscope.

Original languageEnglish (US)
Pages (from-to)133-136
Number of pages4
JournalOptik (Jena)
Volume49
Issue number1
Publication statusPublished - Oct 1977
Externally publishedYes

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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