OBSERVATION OF THICKNESS EXTINCTION CONTOURS WITH A POINT PROJECTION ELECTRON MICROSCOPE.

Research output: Contribution to journalArticle

Abstract

A method for observing thickness extinction contours with a point projection electron microscope is outlined which offers several advantages over normal methods using the conventional transmission electron microscope.

Original languageEnglish (US)
Pages (from-to)133-136
Number of pages4
JournalOptik (Jena)
Volume49
Issue number1
StatePublished - Oct 1977
Externally publishedYes

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extinction
Electron microscopes
electron microscopes
projection

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

OBSERVATION OF THICKNESS EXTINCTION CONTOURS WITH A POINT PROJECTION ELECTRON MICROSCOPE. / Smith, David.

In: Optik (Jena), Vol. 49, No. 1, 10.1977, p. 133-136.

Research output: Contribution to journalArticle

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