Abstract
A method for observing thickness extinction contours with a point projection electron microscope is outlined which offers several advantages over normal methods using the conventional transmission electron microscope.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 133-136 |
| Number of pages | 4 |
| Journal | Optik (Jena) |
| Volume | 49 |
| Issue number | 1 |
| State | Published - Jan 1 1977 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering