OBSERVATION OF THICKNESS EXTINCTION CONTOURS WITH A POINT PROJECTION ELECTRON MICROSCOPE.

Research output: Contribution to journalArticlepeer-review

Abstract

A method for observing thickness extinction contours with a point projection electron microscope is outlined which offers several advantages over normal methods using the conventional transmission electron microscope.

Original languageEnglish (US)
Pages (from-to)133-136
Number of pages4
JournalOptik (Jena)
Volume49
Issue number1
StatePublished - Jan 1 1977
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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