Observation of supported catalyst particles by high-resolution SEM

Ming Hui Yao, David Smith, Abhaya K. Datye

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.

    Original languageEnglish (US)
    Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
    PublisherPubl by San Francisco Press Inc
    Pages782-783
    Number of pages2
    StatePublished - 1993
    EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
    Duration: Aug 1 1993Aug 6 1993

    Other

    OtherProceedings of the 51st Annual Meeting Microscopy Society of America
    CityCincinnati, OH, USA
    Period8/1/938/6/93

    ASJC Scopus subject areas

    • Engineering(all)

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