Observation of supported catalyst particles by high-resolution SEM

Ming Hui Yao; David Smith; Abhaya K. Datye

Observation of supported catalyst particles by high-resolution SEM

Ming Hui Yao, David Smith, Abhaya K. Datye

CLAS-NS: Solid State Science, LeRoy Eyring Center for (CSSS)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this paper, Pt particles supported on TiO ₂ and CeO ₂ are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.

Original language	English (US)
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Publisher	Publ by San Francisco Press Inc
Pages	782-783
Number of pages	2
State	Published - 1993
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

Other

Other	Proceedings of the 51st Annual Meeting Microscopy Society of America
City	Cincinnati, OH, USA
Period	8/1/93 → 8/6/93

ASJC Scopus subject areas

Engineering(all)

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@inproceedings{9cde92d05af14d4cbca9d1354857b522,

title = "Observation of supported catalyst particles by high-resolution SEM",

abstract = "In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques. ",

author = "Yao, {Ming Hui} and David Smith and Datye, {Abhaya K.}",

year = "1993",

language = "English (US)",

pages = "782--783",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

publisher = "Publ by San Francisco Press Inc",

note = "Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

}

TY - GEN

T1 - Observation of supported catalyst particles by high-resolution SEM

AU - Yao, Ming Hui

AU - Smith, David

AU - Datye, Abhaya K.

PY - 1993

Y1 - 1993

N2 - In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.

AB - In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.

UR - http://www.scopus.com/inward/record.url?scp=0027706337&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027706337&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027706337

SP - 782

EP - 783

BT - Proceedings - Annual Meeting, Microscopy Society of America

PB - Publ by San Francisco Press Inc

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -

Observation of supported catalyst particles by high-resolution SEM

Abstract

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ASJC Scopus subject areas

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