Abstract
In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Publisher | Publ by San Francisco Press Inc |
| Pages | 782-783 |
| Number of pages | 2 |
| State | Published - 1993 |
| Event | Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993 |
Other
| Other | Proceedings of the 51st Annual Meeting Microscopy Society of America |
|---|---|
| City | Cincinnati, OH, USA |
| Period | 8/1/93 → 8/6/93 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
Observation of supported catalyst particles by high-resolution SEM. / Yao, Ming Hui; Smith, David; Datye, Abhaya K.
Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. p. 782-783.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Observation of supported catalyst particles by high-resolution SEM
AU - Yao, Ming Hui
AU - Smith, David
AU - Datye, Abhaya K.
PY - 1993
Y1 - 1993
N2 - In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.
AB - In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.
UR - http://www.scopus.com/inward/record.url?scp=0027706337&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0027706337&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0027706337
SP - 782
EP - 783
BT - Proceedings - Annual Meeting, Microscopy Society of America
PB - Publ by San Francisco Press Inc
ER -