Observation of supported catalyst particles by high-resolution SEM

Ming Hui Yao, David Smith, Abhaya K. Datye

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, Pt particles supported on TiO 2 and CeO 2 are studied using a high resolution Hitachi S-500 in-lens field emission SEM. The purpose of this study was to evaluate relative merits and demerits of high resolution SEM for catalysis research, in particular with respect to TEM and STEM techniques.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages782-783
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Yao, M. H., Smith, D., & Datye, A. K. (1993). Observation of supported catalyst particles by high-resolution SEM. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 782-783). Publ by San Francisco Press Inc.