Observation of multiple precipitate layers in MeV Au⁺⁺-implanted silicon

T. L. Alford, N. D. Theodore, E. L. Fleischer, J. W. Mayer, C. B. Carter, P. Børgesen, B. M. Ullrich, N. W. Cheung, H. Wong

Research output: Contribution to journal › Article › peer-review