Observation of multiple precipitate layers in MeV Au++-implanted silicon

T. L. Alford, N. D. Theodore, E. L. Fleischer, J. W. Mayer, C. B. Carter, P. Børgesen, B. M. Ullrich, N. W. Cheung, H. Wong

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13 Scopus citations

Abstract

Room-temperature MeV Au++ implantation into silicon with energies above 1.8 MeV shows a splitting of the Au concentration profile in the Rutherford backscattering spectrometry (RBS) spectra. Cross-section transmission electron microscopy micrographs show two distinct regions of Au precipitates corresponding to the peaks in the RBS spectra. The double peaks can be explained by the segregation of Au into the highly damaged region near the end of the implant range and Au segregation along a dislocation network. These dislocations arise from dynamic beam annealing during the implant and act as paths for rapid diffusion. Precipitation occurs when the Au concentration exceeds the solubility limit. Lower energy implants resulted in the expected Gaussian distributions.

Original languageEnglish (US)
Pages (from-to)1796-1798
Number of pages3
JournalApplied Physics Letters
Volume56
Issue number18
DOIs
StatePublished - Dec 1 1990
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Alford, T. L., Theodore, N. D., Fleischer, E. L., Mayer, J. W., Carter, C. B., Børgesen, P., Ullrich, B. M., Cheung, N. W., & Wong, H. (1990). Observation of multiple precipitate layers in MeV Au++-implanted silicon. Applied Physics Letters, 56(18), 1796-1798. https://doi.org/10.1063/1.103103