Observation of exit surface sputtering in TiO₂ using biased secondary electron imaging

Engineering & Materials Science

• Sputtering 100%
• Electrons 78%
• Imaging techniques 59%
• Electron irradiation 35%
• Ultrahigh vacuum 30%
• Electron beams 23%
• Crystals 19%
• Electron microscopes 18%
• Scanning 15%

Physics & Astronomy

• sputtering 61%
• electrons 32%
• electron irradiation 21%
• rutile 20%
• ultrahigh vacuum 19%
• entrances 19%
• electron microscopes 15%
• electron beams 13%
• damage 13%
• collisions 12%
• scanning 12%
• crystals 9%

Chemical Compounds

• Sputtering 84%
• Electron Particle 42%
• Electron Irradiation 27%
• Surface 24%
• Collision 19%
• Rutile 19%