Abstract
We report experimental results on simultaneous measurement of electron as well as hole transient transport in an Al0.3Ga0.7As-based p-i-n semiconductor nanostructure by using picosecond/subpicosecond Raman spectroscopy. Electron and hole velocity overshoots are directly observed. These experimental results are discussed and explained.
Original language | English (US) |
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Pages (from-to) | S20-S22 |
Journal | Semiconductor Science and Technology |
Volume | 19 |
Issue number | 4 SPEC. ISS. |
DOIs | |
State | Published - Apr 1 2004 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry