Observation of antiferromagnetic resonance in epitaxial films of MnF2

M. Lui, J. Drucker, A. R. King, J. P. Kotthaus, P. K. Hansma, V. Jaccarino

Research output: Contribution to journalArticle

18 Scopus citations

Abstract

Antiferromagnetic resonance has been observed in thin films for what we believe to be the first time. Epitaxial films of MnF2 on MgF2, ZnF2, and FeF2 substrates were used. The resonance positions were very close to, but slightly below, that extrapolated for the bottom of the spin-wave band in bulk MnF2. The linewidths ranged from 15 to 500 Oe, with the narrowest ones corresponding to films with the best degree of epitaxy as judged by texture camera photographs.

Original languageEnglish (US)
Pages (from-to)7720-7723
Number of pages4
JournalPhysical Review B
Volume33
Issue number11
DOIs
StatePublished - Jan 1 1986
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics

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    Lui, M., Drucker, J., King, A. R., Kotthaus, J. P., Hansma, P. K., & Jaccarino, V. (1986). Observation of antiferromagnetic resonance in epitaxial films of MnF2. Physical Review B, 33(11), 7720-7723. https://doi.org/10.1103/PhysRevB.33.7720