Numerical Simulation of Resistive Interconnects for Integrated Circuits

Anthony J. Walton, Robert J. Holwill, J. M. Robertson

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

When interconnects for integrated circuits have been modeled it has been normal to consider them only as straight tracks. In any practical circuit this is not the case and a more rigorous analysis is performed in this paper. The effect of corners and T junctions are analyzed using finite elements and some models are presented which can be used by circuit designers to simulate circuit performance.

Original languageEnglish (US)
Pages (from-to)1252-1258
Number of pages7
JournalIEEE Journal of Solid-State Circuits
Volume20
Issue number6
DOIs
StatePublished - Dec 1985
Externally publishedYes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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