Novel system for X-ray CTR scattering measurement on in-situ observation of OMVPE growth of nitride semiconductor heterostructures

Engineering & Materials Science

• Metallorganic vapor phase epitaxy 100%
• X ray scattering 88%
• Heterojunctions 74%
• Nitrides 68%
• Semiconductor materials 50%
• Growth temperature 36%
• Diffractometers 30%
• Semiconductor growth 22%
• Crystals 22%
• X rays 20%
• Temperature 4%

Physics & Astronomy

• nitrides 52%
• scattering 29%
• x rays 25%
• reactors 16%
• diffractometers 15%
• in situ measurement 7%
• crystals 6%
• safety 6%
• temperature 4%
• room temperature 3%

Chemical Compounds

• Nitride 54%
• Semiconductor 43%
• X-Ray 34%
• Safety 9%
• Ambient Reaction Temperature 6%