@inproceedings{a5b23a55efbd4cd99d67271e0c8576b6,
title = "Notice of Removal: Nano-XRF analysis of metal impurities distribution at grain boundaries during mc-silicon solar cell processing",
abstract = "Photoluminescence (PL) imaging is a widely accepted tool to characterize the quality of multicrystalline and monocrystalline silicon cells. Recently a set of neighboring multicrystalline silicon wafers taken from a cell production line at different processing stages have shown an unexpected PL trend. Band-to-band PL (BPL) and sub-bandgap PL (subPL), were collected for the entire silicon wafers. Interestingly, in various regions of the wafer a reversal of the subPL intensity is observed right after the deposition of the anti-reflective coating (ARC). In this work we present the results of the nanoscale X-ray fluorescence imaging at the points of subPL reversal to evaluate the role of metal decoration on this uncommon behavior and we complement it with our previous findings on the distribution of impurities during cell processing.",
keywords = "Multicrystalline silicon, PL band reversal, Photoluminescence, Sub-band PL, X-ray fluorescence",
author = "Simone Bernardini and Steve Johnston and Bradley West and Naerland, {Tine U.} and Michael Stuckelberger and Barry Lai and Mariana Bertoni",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 44th IEEE Photovoltaic Specialist Conference, PVSC 2017 ; Conference date: 25-06-2017 Through 30-06-2017",
year = "2017",
doi = "10.1109/PVSC.2017.8366189",
language = "English (US)",
series = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--4",
booktitle = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",
}