TY - GEN
T1 - Notice of Removal
T2 - 44th IEEE Photovoltaic Specialist Conference, PVSC 2017
AU - Flicker, Jack
AU - Tamizhmani, Govindasamy
AU - Moorthy, Mathan Kumar
AU - Thiagarajan, Ramanathan
AU - Ayyanar, Raja
N1 - Funding Information:
This material is based upon work supported by the U.S. Department of Energy under Award Number DE-FC36-07GO17034. This work was funded by the DOE Office of Energy Efficiency and Renewable Energy. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.
Publisher Copyright:
© 2017 IEEE.
PY - 2017
Y1 - 2017
N2 - This work has applied a suite of long-term reliability ATs (accelerated tests) to a variety of MLPE devices (module level power electronics such as microinverters and optimizers) from five different manufacturers. This data set is one of first (only [3] is reported for reliability testing in the literature) as well as the largest experimental set in public literature, both in sample size (5 manufacturers including both DC/DC and DC/AC units and 20 units for each test) as well as number of experiments (6 different experimental test conditions) for MLPE devices. The accelerated stress tests include thermal cycling test per IEC 61215 profile, and damp heat test per IEC 61215 profile and they were performed under powered and unpowered conditions. Included in these experiments are the first independent long-term experimental data regarding damp heat as well as the longest term (>9 month) testing of MLPE units reported in literature for thermal cycling. Additionally, this work is the first to show in situ power measurements as well as periodic efficiency measurements over length of experimental tests, demonstrating whether certain tests result in long-term degradation or immediate catastrophic failures. The result of this testing demonstrates the long-term durability and reliability of MLPE units to several accelerated environmental stressors.
AB - This work has applied a suite of long-term reliability ATs (accelerated tests) to a variety of MLPE devices (module level power electronics such as microinverters and optimizers) from five different manufacturers. This data set is one of first (only [3] is reported for reliability testing in the literature) as well as the largest experimental set in public literature, both in sample size (5 manufacturers including both DC/DC and DC/AC units and 20 units for each test) as well as number of experiments (6 different experimental test conditions) for MLPE devices. The accelerated stress tests include thermal cycling test per IEC 61215 profile, and damp heat test per IEC 61215 profile and they were performed under powered and unpowered conditions. Included in these experiments are the first independent long-term experimental data regarding damp heat as well as the longest term (>9 month) testing of MLPE units reported in literature for thermal cycling. Additionally, this work is the first to show in situ power measurements as well as periodic efficiency measurements over length of experimental tests, demonstrating whether certain tests result in long-term degradation or immediate catastrophic failures. The result of this testing demonstrates the long-term durability and reliability of MLPE units to several accelerated environmental stressors.
KW - Accelerated life test
KW - MLPE
KW - Microinverter
KW - Module level power electronics
KW - Optimizer
KW - Photovoltaics
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=85048458851&partnerID=8YFLogxK
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U2 - 10.1109/PVSC.2017.8366251
DO - 10.1109/PVSC.2017.8366251
M3 - Conference contribution
AN - SCOPUS:85048458851
T3 - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
SP - 1
EP - 6
BT - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 June 2017 through 30 June 2017
ER -