Abstract
In the present work an application of z-scan technique to the study of asphaltenes is presented in order to determined their nonlinear properties. For asphaltenes toluene solution a high value of nonlinear refraction index (n 2=6.04 × 10 -12) it is obtained. Strong dependence of the two photon absorption coefficient (β) with the input intensity was observed for higher solutions concentration, which can be explained by molecular aggregation.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Publisher | Society of Photo-Optical Instrumentation Engineers |
| Pages | 148-154 |
| Number of pages | 7 |
| Volume | 3798 |
| State | Published - 1999 |
| Externally published | Yes |
| Event | Proceedings of the 1999 Power-Limiting Materials and Devices - Denver, CO, USA Duration: Jul 21 1999 → Jul 22 1999 |
Other
| Other | Proceedings of the 1999 Power-Limiting Materials and Devices |
|---|---|
| City | Denver, CO, USA |
| Period | 7/21/99 → 7/22/99 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics