Non-Line of Sight Terahert Imaging from a Single Viewpoint

Sai Kiran Doddalla, Georgios Trichopoulos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

We present a novel method for imaging objects hidden around occlusions by exploiting the scattering properties of terahertz (THz) waves. Most building surfaces reflect THz waves strongly in a single direction (specular scattering) and behave as lossy mirrors that allow imaging of non-line-of-sight (NLOS) objects from a single observation location. Interestingly, mirror surfaces can be directly imaged by capturing the backscattered waves due to diffusion scattering. We demonstrate the NLOS THz imaging capability using a backpropagation synthetic aperture radar (SAR) imaging algorithm that corrects the cluttered raw data and acquires accurate THz images of the occluded areas. The new imaging approach is verified through imaging examples in the 220-330 GHz band using common building materials.

Original languageEnglish (US)
Title of host publicationProceedings of the 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1527-1529
Number of pages3
Volume2018-June
ISBN (Print)9781538650677
DOIs
StatePublished - Aug 17 2018
Event2018 IEEE/MTT-S International Microwave Symposium, IMS 2018 - Philadelphia, United States
Duration: Jun 10 2018Jun 15 2018

Other

Other2018 IEEE/MTT-S International Microwave Symposium, IMS 2018
CountryUnited States
CityPhiladelphia
Period6/10/186/15/18

Keywords

  • diffusion scattering
  • non-line of sight imaging
  • terahertz radar imaging

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Doddalla, S. K., & Trichopoulos, G. (2018). Non-Line of Sight Terahert Imaging from a Single Viewpoint. In Proceedings of the 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018 (Vol. 2018-June, pp. 1527-1529). [8439239] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSYM.2018.8439239