TY - GEN
T1 - Non-intrusive cell quantum efficiency measurements of accelerated stress tested photovoltaic modules
AU - Knisely, Brett
AU - Kuitche, Joseph
AU - Tamizhmani, Govindasamy
AU - Korostyshevsky, Aaron
AU - Field, Halden
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/10/15
Y1 - 2014/10/15
N2 - The purpose of this study is to accurately measure quantum efficiency of a single-junction crystalline silicon cell within a module using a non-intrusive methodology. This novel procedure for measuring the quantum efficiency for a specific location on a cell within a module will be referred to in this paper as cell-module quantum efficiency (C-M-QE). This paper will describe the equipment and conditions necessary to measure C-M-QE and discuss the factors that can influence this measurement. The ability to utilize a non-intrusive test to measure quantum efficiency of a cell within a module is extremely beneficial for reliability testing. Detailed methodologies for this innovative test procedure are not widely available in industry because equipment and measurement techniques have not been explored extensively. Results and conclusions provide the overall accuracy of the measurements and discuss the parameters affecting these measurements.
AB - The purpose of this study is to accurately measure quantum efficiency of a single-junction crystalline silicon cell within a module using a non-intrusive methodology. This novel procedure for measuring the quantum efficiency for a specific location on a cell within a module will be referred to in this paper as cell-module quantum efficiency (C-M-QE). This paper will describe the equipment and conditions necessary to measure C-M-QE and discuss the factors that can influence this measurement. The ability to utilize a non-intrusive test to measure quantum efficiency of a cell within a module is extremely beneficial for reliability testing. Detailed methodologies for this innovative test procedure are not widely available in industry because equipment and measurement techniques have not been explored extensively. Results and conclusions provide the overall accuracy of the measurements and discuss the parameters affecting these measurements.
KW - quantum efficiency
KW - reliability
KW - single-junction crystalline silicon cells
KW - spectral responsivity
UR - http://www.scopus.com/inward/record.url?scp=84912096964&partnerID=8YFLogxK
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U2 - 10.1109/PVSC.2014.6925289
DO - 10.1109/PVSC.2014.6925289
M3 - Conference contribution
AN - SCOPUS:84912096964
T3 - 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
SP - 1870
EP - 1874
BT - 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Y2 - 8 June 2014 through 13 June 2014
ER -