Non-intrusive cell quantum efficiency measurements of accelerated stress tested photovoltaic modules

Brett Knisely, Joseph Kuitche, Govindasamy Tamizhmani, Aaron Korostyshevsky, Halden Field

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

    Abstract

    The purpose of this study is to accurately measure quantum efficiency of a single-junction crystalline silicon cell within a module using a non-intrusive methodology. This novel procedure for measuring the quantum efficiency for a specific location on a cell within a module will be referred to in this paper as cell-module quantum efficiency (C-M-QE). This paper will describe the equipment and conditions necessary to measure C-M-QE and discuss the factors that can influence this measurement. The ability to utilize a non-intrusive test to measure quantum efficiency of a cell within a module is extremely beneficial for reliability testing. Detailed methodologies for this innovative test procedure are not widely available in industry because equipment and measurement techniques have not been explored extensively. Results and conclusions provide the overall accuracy of the measurements and discuss the parameters affecting these measurements.

    Original languageEnglish (US)
    Title of host publication2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages1870-1874
    Number of pages5
    ISBN (Print)9781479943982
    DOIs
    StatePublished - Oct 15 2014
    Event40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States
    Duration: Jun 8 2014Jun 13 2014

    Other

    Other40th IEEE Photovoltaic Specialist Conference, PVSC 2014
    CountryUnited States
    CityDenver
    Period6/8/146/13/14

    Fingerprint

    Quantum efficiency
    Silicon
    Crystalline materials
    Testing
    Industry

    Keywords

    • quantum efficiency
    • reliability
    • single-junction crystalline silicon cells
    • spectral responsivity

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials

    Cite this

    Knisely, B., Kuitche, J., Tamizhmani, G., Korostyshevsky, A., & Field, H. (2014). Non-intrusive cell quantum efficiency measurements of accelerated stress tested photovoltaic modules. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 1870-1874). [6925289] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2014.6925289

    Non-intrusive cell quantum efficiency measurements of accelerated stress tested photovoltaic modules. / Knisely, Brett; Kuitche, Joseph; Tamizhmani, Govindasamy; Korostyshevsky, Aaron; Field, Halden.

    2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 1870-1874 6925289.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Knisely, B, Kuitche, J, Tamizhmani, G, Korostyshevsky, A & Field, H 2014, Non-intrusive cell quantum efficiency measurements of accelerated stress tested photovoltaic modules. in 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014., 6925289, Institute of Electrical and Electronics Engineers Inc., pp. 1870-1874, 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, United States, 6/8/14. https://doi.org/10.1109/PVSC.2014.6925289
    Knisely B, Kuitche J, Tamizhmani G, Korostyshevsky A, Field H. Non-intrusive cell quantum efficiency measurements of accelerated stress tested photovoltaic modules. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 1870-1874. 6925289 https://doi.org/10.1109/PVSC.2014.6925289
    Knisely, Brett ; Kuitche, Joseph ; Tamizhmani, Govindasamy ; Korostyshevsky, Aaron ; Field, Halden. / Non-intrusive cell quantum efficiency measurements of accelerated stress tested photovoltaic modules. 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 1870-1874
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