Abstract
Non-equilibrium electron distributions and energy loss rate in a MOCVD-grown In xGa 1-xAs 1-yN y (x =0.03 and y =0.01) epilayer on GaAs substrate have been studied by picosecond Raman spectroscopy. It is demonstrated that for electron density n ≅ 10 18 cm -3, electron distributions can be described very well by Fermi-Dirac distributions with electron temperatures substantially higher than the lattice temperature. From the measurement of electron temperature as a function of the pulse width of excitation laser, the energy loss rate In xGa 1-xAs 1-yN y is estimated to be 64 meV/ps. These experimental results are compared with those of GaAs.
Original language | English (US) |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Editors | H. Jiang, K.T. Tsen, J. Song |
Pages | 96-108 |
Number of pages | 13 |
Volume | 4280 |
DOIs | |
State | Published - 2001 |
Event | Ultrafast Phenomena in Semiconductors V - San Jose, CA, United States Duration: Jan 25 2001 → Jan 26 2001 |
Other
Other | Ultrafast Phenomena in Semiconductors V |
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Country/Territory | United States |
City | San Jose, CA |
Period | 1/25/01 → 1/26/01 |
Keywords
- InGaAsN
- Raman spectroscopy
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics