TY - GEN
T1 - Non-contact probes for THz circuits and integrated devices
AU - Topalli, Kagan
AU - Trichopoulos, Georgios C.
AU - Sertel, Kubilay
PY - 2012/12/10
Y1 - 2012/12/10
N2 - We present a new non-contact approach for device and circuit testing at THz frequencies. The new non-contact probe design is based on beam-tilted THz antennas integrated into the coplanar environment of the monolithic circuits and devices, such as high-speed transistors and diodes. Commercially available THz vector network analyzers (VNAs) (with extension modules) and waveguide-fed horn antennas are used to excite the beam-tilted planar THz antennas integrated into the test device feed lines. For optimal coupling efficiency, the extended hemispherical lens configuration is used. The propagation effects and the antenna coupling artifacts can be removed using a conventional calibration method using several known loads. Initial results based on the full-wave electromagnetic simulations demonstrate that the new non-contact probe can provide much needed functionality for characterizing new electronic devices and electromagnetic components in the THz regime where standard contact probes are either not available or exceedingly costly.
AB - We present a new non-contact approach for device and circuit testing at THz frequencies. The new non-contact probe design is based on beam-tilted THz antennas integrated into the coplanar environment of the monolithic circuits and devices, such as high-speed transistors and diodes. Commercially available THz vector network analyzers (VNAs) (with extension modules) and waveguide-fed horn antennas are used to excite the beam-tilted planar THz antennas integrated into the test device feed lines. For optimal coupling efficiency, the extended hemispherical lens configuration is used. The propagation effects and the antenna coupling artifacts can be removed using a conventional calibration method using several known loads. Initial results based on the full-wave electromagnetic simulations demonstrate that the new non-contact probe can provide much needed functionality for characterizing new electronic devices and electromagnetic components in the THz regime where standard contact probes are either not available or exceedingly costly.
KW - THz antennas
KW - THz device characterization
KW - mmW
KW - sub-mmW
UR - http://www.scopus.com/inward/record.url?scp=84870522102&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84870522102&partnerID=8YFLogxK
U2 - 10.1109/APS.2012.6348500
DO - 10.1109/APS.2012.6348500
M3 - Conference contribution
AN - SCOPUS:84870522102
SN - 9781467304627
T3 - IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
BT - 2012 IEEE International Symposiumon Antennas and Propagation, APSURSI 2012 - Proceedings
T2 - Joint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012
Y2 - 8 July 2012 through 14 July 2012
ER -