Non-contact probes for THz circuits and integrated devices

Kagan Topalli; Georgios C. Trichopoulos; Kubilay Sertel

doi:10.1109/APS.2012.6348500

Non-contact probes for THz circuits and integrated devices

Kagan Topalli, Georgios C. Trichopoulos, Kubilay Sertel

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a new non-contact approach for device and circuit testing at THz frequencies. The new non-contact probe design is based on beam-tilted THz antennas integrated into the coplanar environment of the monolithic circuits and devices, such as high-speed transistors and diodes. Commercially available THz vector network analyzers (VNAs) (with extension modules) and waveguide-fed horn antennas are used to excite the beam-tilted planar THz antennas integrated into the test device feed lines. For optimal coupling efficiency, the extended hemispherical lens configuration is used. The propagation effects and the antenna coupling artifacts can be removed using a conventional calibration method using several known loads. Initial results based on the full-wave electromagnetic simulations demonstrate that the new non-contact probe can provide much needed functionality for characterizing new electronic devices and electromagnetic components in the THz regime where standard contact probes are either not available or exceedingly costly.

Original language	English (US)
Title of host publication	2012 IEEE International Symposiumon Antennas and Propagation, APSURSI 2012 - Proceedings
DOIs	https://doi.org/10.1109/APS.2012.6348500
State	Published - Dec 10 2012
Externally published	Yes
Event	Joint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012 - Chicago, IL, United States Duration: Jul 8 2012 → Jul 14 2012

Publication series

Name	IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
ISSN (Print)	1522-3965

Other

Other	Joint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012
Country	United States
City	Chicago, IL
Period	7/8/12 → 7/14/12

Keywords

THz antennas
THz device characterization
mmW
sub-mmW

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/APS.2012.6348500

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Cite this

Topalli, K., Trichopoulos, G. C., & Sertel, K. (2012). Non-contact probes for THz circuits and integrated devices. In 2012 IEEE International Symposiumon Antennas and Propagation, APSURSI 2012 - Proceedings [6348500] (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)). https://doi.org/10.1109/APS.2012.6348500

Non-contact probes for THz circuits and integrated devices. / Topalli, Kagan; Trichopoulos, Georgios C.; Sertel, Kubilay.

2012 IEEE International Symposiumon Antennas and Propagation, APSURSI 2012 - Proceedings. 2012. 6348500 (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Topalli, K, Trichopoulos, GC & Sertel, K 2012, Non-contact probes for THz circuits and integrated devices. in 2012 IEEE International Symposiumon Antennas and Propagation, APSURSI 2012 - Proceedings., 6348500, IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), Joint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012, Chicago, IL, United States, 7/8/12. https://doi.org/10.1109/APS.2012.6348500

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