Non-contact probe calibration for THz-frequency device characterization

Cosan Caglayan, Georgios Trichopoulos, Kubilay Sertel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a non-contact, on-wafer, broadband device and component testing methodology scalable to the THz band. The 'contactless' probe setup is based on radiative coupling of vector network analyzer test ports onto the coplanar waveguide environment of monolithic devices and integrated circuits. Efficient power coupling is achieved via planar, broadband, antennas that act as the 'virtual' probe-tips on the chip under test. For accurate S-parameter measurements, repeatable errors in the setup are calibrated. In this paper, we demonstrate for the first time experimental validation of the calibration of the new non-contact probes for the 325-500 GHz band (using WR 2.2 frequency extenders and a standard vector network analyzer as the backend). This non-contact probe setup is accurate, low-cost and is readily scalable down to the mmW band and up to the THz band (60GHz-3THz).

Original languageEnglish (US)
Title of host publication82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013
DOIs
StatePublished - 2013
Externally publishedYes
Event82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013 - Columbus, OH, United States
Duration: Nov 20 2013Nov 21 2013

Other

Other82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013
CountryUnited States
CityColumbus, OH
Period11/20/1311/21/13

Fingerprint

Calibration
Electric network analyzers
Coplanar waveguides
Scattering parameters
Measurement errors
Integrated circuits
Antennas
Testing
Costs

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Caglayan, C., Trichopoulos, G., & Sertel, K. (2013). Non-contact probe calibration for THz-frequency device characterization. In 82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013 [6737357] https://doi.org/10.1109/ARFTG-2.2013.6737357

Non-contact probe calibration for THz-frequency device characterization. / Caglayan, Cosan; Trichopoulos, Georgios; Sertel, Kubilay.

82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013. 2013. 6737357.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Caglayan, C, Trichopoulos, G & Sertel, K 2013, Non-contact probe calibration for THz-frequency device characterization. in 82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013., 6737357, 82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013, Columbus, OH, United States, 11/20/13. https://doi.org/10.1109/ARFTG-2.2013.6737357
Caglayan C, Trichopoulos G, Sertel K. Non-contact probe calibration for THz-frequency device characterization. In 82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013. 2013. 6737357 https://doi.org/10.1109/ARFTG-2.2013.6737357
Caglayan, Cosan ; Trichopoulos, Georgios ; Sertel, Kubilay. / Non-contact probe calibration for THz-frequency device characterization. 82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013. 2013.
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