TY - GEN
T1 - Non-contact device and integrated circuit characterization in the G-Band (140-220 GHz)
AU - Caglayan, Cosan
AU - Trichopoulos, Georgios C.
AU - Sertel, Kubilay
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/9/18
Y1 - 2014/9/18
N2 - We demonstrate, for the first time, on-wafer 2-port characterization of passive millimeter wave components using a novel, non-contact measurement probe technique in the G-band (140-220 GHz). This new non-contact approach enables fast, repeatable, low-cost, wear&tear-free, robust, and large-scale evaluation of integrated circuits (IC) and devices. On-wafer calibration standards are used to accurately factor out for the repeatable errors in the non-contact probe setup. Owing to its quasi-optical nature, this novel method is readily scalable for a broad frequency range from mmW to THz (60 GHz-3 THz) bands.
AB - We demonstrate, for the first time, on-wafer 2-port characterization of passive millimeter wave components using a novel, non-contact measurement probe technique in the G-band (140-220 GHz). This new non-contact approach enables fast, repeatable, low-cost, wear&tear-free, robust, and large-scale evaluation of integrated circuits (IC) and devices. On-wafer calibration standards are used to accurately factor out for the repeatable errors in the non-contact probe setup. Owing to its quasi-optical nature, this novel method is readily scalable for a broad frequency range from mmW to THz (60 GHz-3 THz) bands.
KW - millimeter waves
KW - on-wafer measurements
KW - sub-millimeter waves
KW - terahertz
UR - http://www.scopus.com/inward/record.url?scp=84907870291&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84907870291&partnerID=8YFLogxK
U2 - 10.1109/APS.2014.6904479
DO - 10.1109/APS.2014.6904479
M3 - Conference contribution
AN - SCOPUS:84907870291
T3 - IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
SP - 295
EP - 296
BT - 2014 IEEE Antennas and Propagation Society International Symposium(APSURSI)
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 IEEE Antennas and Propagation Society International Symposium, APSURSI 2014
Y2 - 6 July 2014 through 11 July 2014
ER -