@inproceedings{19b59dc8c779445693efa99936f57848,
title = "Noise analysis of MREIT at 3T and 11T field strength",
abstract = "In Magnetic Resonance Electrical Impedance Tomography (MREIT), we measure the induced magnetic flux density inside an imaging object subject to an external injection current. The magnetic flux density is contaminated with noise and this ultimately limits the quality of reconstructed conductivity and current density images. By using two methods to analyze amounts of noise in 3T and 11T MREIT systems, we found that a carefully designed MREIT study will be able to reduce the noise level below 0.1 nT.",
keywords = "MREIT, Magnetic flux density, Noise analysis",
author = "Sadleir, {R. J.} and Grant, {S. C.} and Zhang, {S. U.} and Oh, {S. H.} and Lee, {B. I.} and Pyo, {H. C.} and Park, {C. J.} and Woo, {E. J.} and Lee, {S. Y.} and Seo, {J. K.} and O. Kwon",
note = "Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005 ; Conference date: 01-09-2005 Through 04-09-2005",
year = "2005",
doi = "10.1109/iembs.2005.1617011",
language = "English (US)",
isbn = "0780387406",
series = "Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2637--2640",
booktitle = "Proceedings of the 2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005",
}