Noise analysis of MREIT at 3T and 11T field strength

Rosalind Sadleir, S. C. Grant, S. U. Zhang, S. H. Oh, B. I. Lee, H. C. Pyo, C. J. Park, E. J. Woo, S. Y. Lee, J. K. Seo, O. Kwon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In Magnetic Resonance Electrical Impedance Tomography (MREIT), we measure the induced magnetic flux density inside an imaging object subject to an external injection current. The magnetic flux density is contaminated with noise and this ultimately limits the quality of reconstructed conductivity and current density images. By using two methods to analyze amounts of noise in 3T and 11T MREIT systems, we found that a carefully designed MREIT study will be able to reduce the noise level below 0.1 nT.

Original languageEnglish (US)
Title of host publicationAnnual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Pages2637-2640
Number of pages4
Volume7 VOLS
StatePublished - 2005
Externally publishedYes
Event2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005 - Shanghai, China
Duration: Sep 1 2005Sep 4 2005

Other

Other2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005
CountryChina
CityShanghai
Period9/1/059/4/05

Fingerprint

Acoustic impedance
Magnetic resonance
Tomography
Magnetic flux
Current density
Imaging techniques

Keywords

  • Magnetic flux density
  • MREIT
  • Noise analysis

ASJC Scopus subject areas

  • Bioengineering

Cite this

Sadleir, R., Grant, S. C., Zhang, S. U., Oh, S. H., Lee, B. I., Pyo, H. C., ... Kwon, O. (2005). Noise analysis of MREIT at 3T and 11T field strength. In Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings (Vol. 7 VOLS, pp. 2637-2640). [1617011]

Noise analysis of MREIT at 3T and 11T field strength. / Sadleir, Rosalind; Grant, S. C.; Zhang, S. U.; Oh, S. H.; Lee, B. I.; Pyo, H. C.; Park, C. J.; Woo, E. J.; Lee, S. Y.; Seo, J. K.; Kwon, O.

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. Vol. 7 VOLS 2005. p. 2637-2640 1617011.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sadleir, R, Grant, SC, Zhang, SU, Oh, SH, Lee, BI, Pyo, HC, Park, CJ, Woo, EJ, Lee, SY, Seo, JK & Kwon, O 2005, Noise analysis of MREIT at 3T and 11T field strength. in Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. vol. 7 VOLS, 1617011, pp. 2637-2640, 2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005, Shanghai, China, 9/1/05.
Sadleir R, Grant SC, Zhang SU, Oh SH, Lee BI, Pyo HC et al. Noise analysis of MREIT at 3T and 11T field strength. In Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. Vol. 7 VOLS. 2005. p. 2637-2640. 1617011
Sadleir, Rosalind ; Grant, S. C. ; Zhang, S. U. ; Oh, S. H. ; Lee, B. I. ; Pyo, H. C. ; Park, C. J. ; Woo, E. J. ; Lee, S. Y. ; Seo, J. K. ; Kwon, O. / Noise analysis of MREIT at 3T and 11T field strength. Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. Vol. 7 VOLS 2005. pp. 2637-2640
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