No-reference objective wavelet based noise immune image sharpness metric

R. Ferzli, Lina Karam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

48 Citations (Scopus)

Abstract

This paper focuses on no-reference image sharpness/blurriness metrics due to their importance in image, video, and biomedical applications. Simulation results show that existing no-reference objective image sharpness metrics fail to predict correctly the sharpness of images in the presence of noise. A noise-immune wavelet-based sharpness metric is proposed based on the Lipschitz regularity for differentiating between edges and noise singularities. Comparison results reveal the superiority of the proposed method when dealing with a moderate noisy environment.

Original languageEnglish (US)
Title of host publicationProceedings - International Conference on Image Processing, ICIP
Pages405-408
Number of pages4
Volume1
DOIs
StatePublished - 2005
EventIEEE International Conference on Image Processing 2005, ICIP 2005 - Genova, Italy
Duration: Sep 11 2005Sep 14 2005

Other

OtherIEEE International Conference on Image Processing 2005, ICIP 2005
CountryItaly
CityGenova
Period9/11/059/14/05

Keywords

  • Blurriness
  • No-reference quality metric
  • Noise immune sharpness metric
  • Sharpness

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ferzli, R., & Karam, L. (2005). No-reference objective wavelet based noise immune image sharpness metric. In Proceedings - International Conference on Image Processing, ICIP (Vol. 1, pp. 405-408). [1529773] https://doi.org/10.1109/ICIP.2005.1529773

No-reference objective wavelet based noise immune image sharpness metric. / Ferzli, R.; Karam, Lina.

Proceedings - International Conference on Image Processing, ICIP. Vol. 1 2005. p. 405-408 1529773.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ferzli, R & Karam, L 2005, No-reference objective wavelet based noise immune image sharpness metric. in Proceedings - International Conference on Image Processing, ICIP. vol. 1, 1529773, pp. 405-408, IEEE International Conference on Image Processing 2005, ICIP 2005, Genova, Italy, 9/11/05. https://doi.org/10.1109/ICIP.2005.1529773
Ferzli R, Karam L. No-reference objective wavelet based noise immune image sharpness metric. In Proceedings - International Conference on Image Processing, ICIP. Vol. 1. 2005. p. 405-408. 1529773 https://doi.org/10.1109/ICIP.2005.1529773
Ferzli, R. ; Karam, Lina. / No-reference objective wavelet based noise immune image sharpness metric. Proceedings - International Conference on Image Processing, ICIP. Vol. 1 2005. pp. 405-408
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