No-reference objective wavelet based noise immune image sharpness metric

R. Ferzli, Lina Karam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

49 Scopus citations

Abstract

This paper focuses on no-reference image sharpness/blurriness metrics due to their importance in image, video, and biomedical applications. Simulation results show that existing no-reference objective image sharpness metrics fail to predict correctly the sharpness of images in the presence of noise. A noise-immune wavelet-based sharpness metric is proposed based on the Lipschitz regularity for differentiating between edges and noise singularities. Comparison results reveal the superiority of the proposed method when dealing with a moderate noisy environment.

Original languageEnglish (US)
Title of host publicationIEEE International Conference on Image Processing 2005, ICIP 2005
Pages405-408
Number of pages4
DOIs
StatePublished - Dec 1 2005
EventIEEE International Conference on Image Processing 2005, ICIP 2005 - Genova, Italy
Duration: Sep 11 2005Sep 14 2005

Publication series

NameProceedings - International Conference on Image Processing, ICIP
Volume1
ISSN (Print)1522-4880

Other

OtherIEEE International Conference on Image Processing 2005, ICIP 2005
CountryItaly
CityGenova
Period9/11/059/14/05

Keywords

  • Blurriness
  • No-reference quality metric
  • Noise immune sharpness metric
  • Sharpness

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ferzli, R., & Karam, L. (2005). No-reference objective wavelet based noise immune image sharpness metric. In IEEE International Conference on Image Processing 2005, ICIP 2005 (pp. 405-408). [1529773] (Proceedings - International Conference on Image Processing, ICIP; Vol. 1). https://doi.org/10.1109/ICIP.2005.1529773