Abstract
Temperature variations in the NICMOS detectors arise from a variety of thermal sources. These thermal variations lead to several image artifacts which must be removed before making quantitative scientific measurements from NICMOS data. Future instruments would do well to minimize sources of thermal instabilities in their detectors. A related problem is the inability to directly measure detector temperature from bias due to the instability of the low-voltage power supply in NICMOS. Identifying ways to directly monitor detector temperatures would be an important benefit for future missions.
Original language | English (US) |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Editors | J.C. Mather |
Pages | 281-288 |
Number of pages | 8 |
Volume | 5487 |
Edition | PART 1 |
DOIs | |
State | Published - 2004 |
Externally published | Yes |
Event | Optical, Infrared, and Millimeter Space Telecopes - Glasgow, United Kingdom Duration: Jun 21 2004 → Jun 25 2004 |
Other
Other | Optical, Infrared, and Millimeter Space Telecopes |
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Country/Territory | United Kingdom |
City | Glasgow |
Period | 6/21/04 → 6/25/04 |
Keywords
- Hubble Space Telescope
- Infrared Instrumentation
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics