New model for slow current drift in InP metal-insulator-semiconductor field-effect transistors

S. M. Goodnick, T. Hwang, C. W. Wilmsen

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Fingerprint Dive into the research topics of 'New model for slow current drift in InP metal-insulator-semiconductor field-effect transistors'. Together they form a unique fingerprint.

Physics & Astronomy