New directions in X-ray microscopy

Roger Falcone, Chris Jacobsen, Janos Kirz, Stefano Marchesini, David Shapiro, John Spence

Research output: Contribution to journalArticle

56 Citations (Scopus)

Abstract

The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.

Original languageEnglish (US)
Pages (from-to)293-318
Number of pages26
JournalContemporary Physics
Volume52
Issue number4
DOIs
StatePublished - Jul 2011

Fingerprint

microscopy
x rays
microscopes
high resolution
geometrical optics
radiation damage
holography
electron microscopy
light sources
synchrotrons
brightness
spatial resolution
scanning
radiation
diffraction

Keywords

  • Phase-contrast
  • X-ray diffraction
  • X-ray microscopy
  • X-ray optics

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Falcone, R., Jacobsen, C., Kirz, J., Marchesini, S., Shapiro, D., & Spence, J. (2011). New directions in X-ray microscopy. Contemporary Physics, 52(4), 293-318. https://doi.org/10.1080/00107514.2011.589662

New directions in X-ray microscopy. / Falcone, Roger; Jacobsen, Chris; Kirz, Janos; Marchesini, Stefano; Shapiro, David; Spence, John.

In: Contemporary Physics, Vol. 52, No. 4, 07.2011, p. 293-318.

Research output: Contribution to journalArticle

Falcone, R, Jacobsen, C, Kirz, J, Marchesini, S, Shapiro, D & Spence, J 2011, 'New directions in X-ray microscopy', Contemporary Physics, vol. 52, no. 4, pp. 293-318. https://doi.org/10.1080/00107514.2011.589662
Falcone R, Jacobsen C, Kirz J, Marchesini S, Shapiro D, Spence J. New directions in X-ray microscopy. Contemporary Physics. 2011 Jul;52(4):293-318. https://doi.org/10.1080/00107514.2011.589662
Falcone, Roger ; Jacobsen, Chris ; Kirz, Janos ; Marchesini, Stefano ; Shapiro, David ; Spence, John. / New directions in X-ray microscopy. In: Contemporary Physics. 2011 ; Vol. 52, No. 4. pp. 293-318.
@article{2dae2b1e54a2498bb0da93df9f7e44ae,
title = "New directions in X-ray microscopy",
abstract = "The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.",
keywords = "Phase-contrast, X-ray diffraction, X-ray microscopy, X-ray optics",
author = "Roger Falcone and Chris Jacobsen and Janos Kirz and Stefano Marchesini and David Shapiro and John Spence",
year = "2011",
month = "7",
doi = "10.1080/00107514.2011.589662",
language = "English (US)",
volume = "52",
pages = "293--318",
journal = "Contemporary Physics",
issn = "0010-7514",
publisher = "Taylor and Francis Ltd.",
number = "4",

}

TY - JOUR

T1 - New directions in X-ray microscopy

AU - Falcone, Roger

AU - Jacobsen, Chris

AU - Kirz, Janos

AU - Marchesini, Stefano

AU - Shapiro, David

AU - Spence, John

PY - 2011/7

Y1 - 2011/7

N2 - The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.

AB - The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.

KW - Phase-contrast

KW - X-ray diffraction

KW - X-ray microscopy

KW - X-ray optics

UR - http://www.scopus.com/inward/record.url?scp=79960171000&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79960171000&partnerID=8YFLogxK

U2 - 10.1080/00107514.2011.589662

DO - 10.1080/00107514.2011.589662

M3 - Article

AN - SCOPUS:79960171000

VL - 52

SP - 293

EP - 318

JO - Contemporary Physics

JF - Contemporary Physics

SN - 0010-7514

IS - 4

ER -