Abstract
The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 293-318 |
| Number of pages | 26 |
| Journal | Contemporary Physics |
| Volume | 52 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jul 2011 |
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Keywords
- Phase-contrast
- X-ray diffraction
- X-ray microscopy
- X-ray optics
ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
New directions in X-ray microscopy. / Falcone, Roger; Jacobsen, Chris; Kirz, Janos; Marchesini, Stefano; Shapiro, David; Spence, John.
In: Contemporary Physics, Vol. 52, No. 4, 07.2011, p. 293-318.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - New directions in X-ray microscopy
AU - Falcone, Roger
AU - Jacobsen, Chris
AU - Kirz, Janos
AU - Marchesini, Stefano
AU - Shapiro, David
AU - Spence, John
PY - 2011/7
Y1 - 2011/7
N2 - The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.
AB - The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.
KW - Phase-contrast
KW - X-ray diffraction
KW - X-ray microscopy
KW - X-ray optics
UR - http://www.scopus.com/inward/record.url?scp=79960171000&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79960171000&partnerID=8YFLogxK
U2 - 10.1080/00107514.2011.589662
DO - 10.1080/00107514.2011.589662
M3 - Article
AN - SCOPUS:79960171000
VL - 52
SP - 293
EP - 318
JO - Contemporary Physics
JF - Contemporary Physics
SN - 0010-7514
IS - 4
ER -