New directions in X-ray microscopy

Roger Falcone; Chris Jacobsen; Janos Kirz; Stefano Marchesini; David Shapiro; John Spence

doi:10.1080/00107514.2011.589662

New directions in X-ray microscopy

Roger Falcone, Chris Jacobsen, Janos Kirz, Stefano Marchesini, David Shapiro, John Spence

Research output: Contribution to journal › Article › peer-review

60 Scopus citations

Abstract

The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.

Original language	English (US)
Pages (from-to)	293-318
Number of pages	26
Journal	Contemporary Physics
Volume	52
Issue number	4
DOIs	https://doi.org/10.1080/00107514.2011.589662
State	Published - Jul 1 2011

Keywords

Phase-contrast
X-ray diffraction
X-ray microscopy
X-ray optics

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1080/00107514.2011.589662

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@article{2dae2b1e54a2498bb0da93df9f7e44ae,

title = "New directions in X-ray microscopy",

abstract = "The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.",

keywords = "Phase-contrast, X-ray diffraction, X-ray microscopy, X-ray optics",

author = "Roger Falcone and Chris Jacobsen and Janos Kirz and Stefano Marchesini and David Shapiro and John Spence",

year = "2011",

month = jul,

day = "1",

doi = "10.1080/00107514.2011.589662",

language = "English (US)",

volume = "52",

pages = "293--318",

journal = "Contemporary Physics",

issn = "0010-7514",

publisher = "Taylor and Francis Ltd.",

number = "4",

}

TY - JOUR

T1 - New directions in X-ray microscopy

AU - Falcone, Roger

AU - Jacobsen, Chris

AU - Kirz, Janos

AU - Marchesini, Stefano

AU - Shapiro, David

AU - Spence, John

PY - 2011/7/1

Y1 - 2011/7/1

N2 - The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.

AB - The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.

KW - Phase-contrast

KW - X-ray diffraction

KW - X-ray microscopy

KW - X-ray optics

UR - http://www.scopus.com/inward/record.url?scp=79960171000&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79960171000&partnerID=8YFLogxK

U2 - 10.1080/00107514.2011.589662

DO - 10.1080/00107514.2011.589662

M3 - Article

AN - SCOPUS:79960171000

VL - 52

SP - 293

EP - 318

JO - Contemporary Physics

JF - Contemporary Physics

SN - 0010-7514

IS - 4

ER -