Abstract
The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.
Original language | English (US) |
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Pages (from-to) | 293-318 |
Number of pages | 26 |
Journal | Contemporary Physics |
Volume | 52 |
Issue number | 4 |
DOIs | |
State | Published - Jul 1 2011 |
Keywords
- Phase-contrast
- X-ray diffraction
- X-ray microscopy
- X-ray optics
ASJC Scopus subject areas
- Physics and Astronomy(all)