Near-edge fine-structure analysis of core-shell electronic absorption edges in silicon and its refractory compounds with the use of electron-energy-loss microspectroscopy

Physics & Astronomy

• refractories 100%
• fine structure 74%
• energy dissipation 72%
• electron energy 68%
• chemical effects 58%
• silicon 48%
• electronics 46%
• valence 16%
• ionization 15%
• cross sections 13%
• atoms 11%
• excitation 11%
• silicon nitrides 11%
• silicon carbides 10%
• periodic variations 10%
• backscattering 10%
• plane waves 9%
• electron microscopes 8%
• wave functions 8%
• silicon dioxide 8%
• electronic structure 8%
• orbitals 7%
• spectroscopy 5%
• crystals 5%