Near edge fine structure analysis of copper in Cu-Bi2Se3 topological insulators

Ganesh Subramanian; Nan Jiang; Yulin Chen; John Spence

doi:10.1017/S1431927614002529

Near edge fine structure analysis of copper in Cu-Bi₂Se₃ topological insulators

Ganesh Subramanian, Nan Jiang, Yulin Chen, John Spence

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	160-161
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614002529
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927614002529

Cite this

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title = "Near edge fine structure analysis of copper in Cu-Bi2Se3 topological insulators",

author = "Ganesh Subramanian and Nan Jiang and Yulin Chen and John Spence",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614002529",

language = "English (US)",

volume = "20",

pages = "160--161",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Near edge fine structure analysis of copper in Cu-Bi2Se3 topological insulators

AU - Subramanian, Ganesh

AU - Jiang, Nan

AU - Chen, Yulin

AU - Spence, John

PY - 2014/8/1

Y1 - 2014/8/1

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U2 - 10.1017/S1431927614002529

DO - 10.1017/S1431927614002529

M3 - Conference article

AN - SCOPUS:84927937128

SN - 1431-9276

VL - 20

SP - 160

EP - 161

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Near edge fine structure analysis of copper in Cu-Bi2Se3 topological insulators

ASJC Scopus subject areas

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Near edge fine structure analysis of copper in Cu-Bi₂Se₃ topological insulators