Near edge fine structure analysis of copper in Cu-Bi<inf>2</inf>Se<inf>3</inf> topological insulators

Ganesh Subramanian, Nan Jiang, Yulin Chen, John Spence

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish (US)
Pages (from-to)160-161
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014

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Near edge fine structure analysis of copper in Cu-Bi<inf>2</inf>Se<inf>3</inf> topological insulators. / Subramanian, Ganesh; Jiang, Nan; Chen, Yulin; Spence, John.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 160-161.

Research output: Contribution to journalArticle

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