Near and far field characterization of radiation from ultra-fast electronic systems

K. A. Remley, A. Weisshaar, Stephen Goodnick, V. K. Tripathi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A numerical technique combining the FDTD method with a spatial transformation technique, the Kirchhoff surface integral, is proposed for determination of near and far field radiation from microwave, millimeter wave, or ultra-fast electronic systems. This technique is shown to be extremely accurate, and is often more computationally expedient than use of the FDTD alone. The technique is applied to characterize radiation from structures with inhomogeneous material parameters, offering a more accurate portrait of radiative fields than has been previously reported.

Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
EditorsR. Meixner
PublisherIEEE
Pages1073-1076
Number of pages4
Volume2
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1998 IEEE MTT-S International Microwave Symposium. Part 1 (of 3) - Baltimore, MD, USA
Duration: Jun 7 1998Jun 12 1998

Other

OtherProceedings of the 1998 IEEE MTT-S International Microwave Symposium. Part 1 (of 3)
CityBaltimore, MD, USA
Period6/7/986/12/98

Fingerprint

finite difference time domain method
far fields
near fields
Radiation
radiation
electronics
Millimeter waves
millimeter waves
Microwaves
microwaves

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Remley, K. A., Weisshaar, A., Goodnick, S., & Tripathi, V. K. (1998). Near and far field characterization of radiation from ultra-fast electronic systems. In R. Meixner (Ed.), IEEE MTT-S International Microwave Symposium Digest (Vol. 2, pp. 1073-1076). IEEE.

Near and far field characterization of radiation from ultra-fast electronic systems. / Remley, K. A.; Weisshaar, A.; Goodnick, Stephen; Tripathi, V. K.

IEEE MTT-S International Microwave Symposium Digest. ed. / R. Meixner. Vol. 2 IEEE, 1998. p. 1073-1076.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Remley, KA, Weisshaar, A, Goodnick, S & Tripathi, VK 1998, Near and far field characterization of radiation from ultra-fast electronic systems. in R Meixner (ed.), IEEE MTT-S International Microwave Symposium Digest. vol. 2, IEEE, pp. 1073-1076, Proceedings of the 1998 IEEE MTT-S International Microwave Symposium. Part 1 (of 3), Baltimore, MD, USA, 6/7/98.
Remley KA, Weisshaar A, Goodnick S, Tripathi VK. Near and far field characterization of radiation from ultra-fast electronic systems. In Meixner R, editor, IEEE MTT-S International Microwave Symposium Digest. Vol. 2. IEEE. 1998. p. 1073-1076
Remley, K. A. ; Weisshaar, A. ; Goodnick, Stephen ; Tripathi, V. K. / Near and far field characterization of radiation from ultra-fast electronic systems. IEEE MTT-S International Microwave Symposium Digest. editor / R. Meixner. Vol. 2 IEEE, 1998. pp. 1073-1076
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