Mathematics
Inspection
100%
Paradigm
89%
Defects
72%
Near-field
47%
Antenna
44%
Semiconductor Manufacturing
30%
Photonics
29%
Manufacturing Industries
27%
Wafer
27%
Microwave
24%
Throughput
23%
Scanning
23%
Laser
22%
Far Field
21%
Wavelength
20%
Filtering
18%
Entire
15%
Physics
14%
Numerical Simulation
13%
Experiment
13%
Costs
13%
Line
12%
Range of data
11%
Standards
10%
Chemical Compounds
Wave
84%
Filtration
78%
Microwave
73%
Semiconductor
68%
Industry
66%
Simulation
57%
Nanomaterial
57%
Application
28%
Physics & Astronomy
inspection
84%
defects
40%
antennas
31%
near fields
30%
microwave frequencies
18%
far fields
16%
industries
15%
manufacturing
15%
costs
13%
wafers
13%
photonics
12%
physics
11%
scanning
11%
wavelengths
8%
lasers
7%
simulation
6%
Engineering & Materials Science
Inspection
68%
Defects
49%
Antennas
23%
Microwave frequencies
23%
Photonics
20%
Semiconductor materials
16%
Wavelength
15%
Physics
15%
Scanning
13%
Lasers
13%
Throughput
12%
Chemical analysis
11%
Computer simulation
9%
Industry
7%
Costs
6%
Experiments
6%