Nanoscale Probing of Local Electrical Characteristics on MBE-Grown Bi2Te3 Surfaces under Ambient Conditions

Rita J. Macedo, Sara E. Harrison, Tatiana S. Dorofeeva, James S. Harris, Richard Kiehl

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The local electrical characteristics on the surface of MBE-grown Bi2Te3 are probed under ambient conditions by conductive atomic force microscopy. Nanoscale mapping reveals a 10-100× enhancement in current at step-edges compared to that on terraces. Analysis of the local current-voltage characteristics indicates that the transport mechanism is similar for step-edges and terraces. Comparison of the results with those for control samples shows that the current enhancement is not a measurement artifact but instead is due to local differences in electronic properties. The likelihood of various possible mechanisms is discussed. The absence of enhancement at the step-edges for graphite terraces is consistent with the intriguing possibility that spin-orbit coupling and topological effects play a significant role in the step-edge current enhancement in Bi2Te3.

Original languageEnglish (US)
Pages (from-to)4241-4247
Number of pages7
JournalNano Letters
Volume15
Issue number7
DOIs
StatePublished - Jul 8 2015
Externally publishedYes

Fingerprint

Graphite
Current voltage characteristics
Molecular beam epitaxy
Electronic properties
Atomic force microscopy
Orbits
augmentation
artifacts
graphite
atomic force microscopy
orbits
electric potential
electronics

Keywords

  • atomic force microscopy
  • Bismuth telluride
  • molecular beam epitaxy
  • topological insulators
  • van der Waals epitaxy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanical Engineering

Cite this

Nanoscale Probing of Local Electrical Characteristics on MBE-Grown Bi2Te3 Surfaces under Ambient Conditions. / Macedo, Rita J.; Harrison, Sara E.; Dorofeeva, Tatiana S.; Harris, James S.; Kiehl, Richard.

In: Nano Letters, Vol. 15, No. 7, 08.07.2015, p. 4241-4247.

Research output: Contribution to journalArticle

Macedo, Rita J. ; Harrison, Sara E. ; Dorofeeva, Tatiana S. ; Harris, James S. ; Kiehl, Richard. / Nanoscale Probing of Local Electrical Characteristics on MBE-Grown Bi2Te3 Surfaces under Ambient Conditions. In: Nano Letters. 2015 ; Vol. 15, No. 7. pp. 4241-4247.
@article{c1793e950bcc4c90a68c0e54ae8a5c85,
title = "Nanoscale Probing of Local Electrical Characteristics on MBE-Grown Bi2Te3 Surfaces under Ambient Conditions",
abstract = "The local electrical characteristics on the surface of MBE-grown Bi2Te3 are probed under ambient conditions by conductive atomic force microscopy. Nanoscale mapping reveals a 10-100× enhancement in current at step-edges compared to that on terraces. Analysis of the local current-voltage characteristics indicates that the transport mechanism is similar for step-edges and terraces. Comparison of the results with those for control samples shows that the current enhancement is not a measurement artifact but instead is due to local differences in electronic properties. The likelihood of various possible mechanisms is discussed. The absence of enhancement at the step-edges for graphite terraces is consistent with the intriguing possibility that spin-orbit coupling and topological effects play a significant role in the step-edge current enhancement in Bi2Te3.",
keywords = "atomic force microscopy, Bismuth telluride, molecular beam epitaxy, topological insulators, van der Waals epitaxy",
author = "Macedo, {Rita J.} and Harrison, {Sara E.} and Dorofeeva, {Tatiana S.} and Harris, {James S.} and Richard Kiehl",
year = "2015",
month = "7",
day = "8",
doi = "10.1021/acs.nanolett.5b00542",
language = "English (US)",
volume = "15",
pages = "4241--4247",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "7",

}

TY - JOUR

T1 - Nanoscale Probing of Local Electrical Characteristics on MBE-Grown Bi2Te3 Surfaces under Ambient Conditions

AU - Macedo, Rita J.

AU - Harrison, Sara E.

AU - Dorofeeva, Tatiana S.

AU - Harris, James S.

AU - Kiehl, Richard

PY - 2015/7/8

Y1 - 2015/7/8

N2 - The local electrical characteristics on the surface of MBE-grown Bi2Te3 are probed under ambient conditions by conductive atomic force microscopy. Nanoscale mapping reveals a 10-100× enhancement in current at step-edges compared to that on terraces. Analysis of the local current-voltage characteristics indicates that the transport mechanism is similar for step-edges and terraces. Comparison of the results with those for control samples shows that the current enhancement is not a measurement artifact but instead is due to local differences in electronic properties. The likelihood of various possible mechanisms is discussed. The absence of enhancement at the step-edges for graphite terraces is consistent with the intriguing possibility that spin-orbit coupling and topological effects play a significant role in the step-edge current enhancement in Bi2Te3.

AB - The local electrical characteristics on the surface of MBE-grown Bi2Te3 are probed under ambient conditions by conductive atomic force microscopy. Nanoscale mapping reveals a 10-100× enhancement in current at step-edges compared to that on terraces. Analysis of the local current-voltage characteristics indicates that the transport mechanism is similar for step-edges and terraces. Comparison of the results with those for control samples shows that the current enhancement is not a measurement artifact but instead is due to local differences in electronic properties. The likelihood of various possible mechanisms is discussed. The absence of enhancement at the step-edges for graphite terraces is consistent with the intriguing possibility that spin-orbit coupling and topological effects play a significant role in the step-edge current enhancement in Bi2Te3.

KW - atomic force microscopy

KW - Bismuth telluride

KW - molecular beam epitaxy

KW - topological insulators

KW - van der Waals epitaxy

UR - http://www.scopus.com/inward/record.url?scp=84936771393&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84936771393&partnerID=8YFLogxK

U2 - 10.1021/acs.nanolett.5b00542

DO - 10.1021/acs.nanolett.5b00542

M3 - Article

AN - SCOPUS:84936771393

VL - 15

SP - 4241

EP - 4247

JO - Nano Letters

JF - Nano Letters

SN - 1530-6984

IS - 7

ER -