Nanoscale dislocation patterning by scratching in an atomic force microscope

Fernando Ponce, Q. Y. Wei, Z. H. Wu, H. D. Fonseca-Filho, C. M. Almeida, R. Prioli, D. Cherns

Research output: Contribution to journalArticle

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Abstract

The nature of nanoscratching as a lithographic technique for site-selective generation of dislocations is investigated for use in the growth of nanostructures. Linear arrays of dislocations have been selectively introduced into (001) indium phosphide crystals by dragging a diamond tip in an atomic force microscope. The nature of plastic deformation is found to depend on the scratch direction. For 〈 110 〉 directions, anisotropic butterflylike structures with mostly screw dislocations indicate rotational motion in the vicinity of the advancing tip. For 〈 100 〉 directions, the dislocations do not propagate far from the surface, possibly due to interlocking between dislocations on different slip planes, with a surface morphology suggesting melting of the near surface region by frictional heat. These results indicate that growth of nanostructures should be highly dependent on the direction of the nanoscratch.

Original languageEnglish (US)
Article number076106
JournalJournal of Applied Physics
Volume106
Issue number7
DOIs
StatePublished - 2009

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microscopes
indium phosphides
screw dislocations
linear arrays
locking
plastic deformation
slip
diamonds
melting
heat
crystals

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Ponce, F., Wei, Q. Y., Wu, Z. H., Fonseca-Filho, H. D., Almeida, C. M., Prioli, R., & Cherns, D. (2009). Nanoscale dislocation patterning by scratching in an atomic force microscope. Journal of Applied Physics, 106(7), [076106]. https://doi.org/10.1063/1.3245321

Nanoscale dislocation patterning by scratching in an atomic force microscope. / Ponce, Fernando; Wei, Q. Y.; Wu, Z. H.; Fonseca-Filho, H. D.; Almeida, C. M.; Prioli, R.; Cherns, D.

In: Journal of Applied Physics, Vol. 106, No. 7, 076106, 2009.

Research output: Contribution to journalArticle

Ponce, F, Wei, QY, Wu, ZH, Fonseca-Filho, HD, Almeida, CM, Prioli, R & Cherns, D 2009, 'Nanoscale dislocation patterning by scratching in an atomic force microscope', Journal of Applied Physics, vol. 106, no. 7, 076106. https://doi.org/10.1063/1.3245321
Ponce, Fernando ; Wei, Q. Y. ; Wu, Z. H. ; Fonseca-Filho, H. D. ; Almeida, C. M. ; Prioli, R. ; Cherns, D. / Nanoscale dislocation patterning by scratching in an atomic force microscope. In: Journal of Applied Physics. 2009 ; Vol. 106, No. 7.
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