Nanocharacterization and electrical properties of grain boundaries in Gd/Pr doubly-doped ceria

W. J. Bowman, J. Zhu, Peter Crozier

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)1894-1895
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

ASJC Scopus subject areas

  • Instrumentation

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