Nano-XRF and micro-raman studies of metal impurity decoration around dislocations in multicrystalline silicon

Mariana Bertoni; G. Sarau; D. P. Fenning; M. Rinio; V. Rose; J. Maser; T. Buonassisi

doi:10.1109/PVSC.2012.6317904

Nano-XRF and micro-raman studies of metal impurity decoration around dislocations in multicrystalline silicon

Mariana Bertoni, G. Sarau, D. P. Fenning, M. Rinio, V. Rose, J. Maser, T. Buonassisi

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

We push the resolution limits of synchrotron-based nano-X-ray fluorescence mapping below 100 nm to investigate the fundamental differences between benign and deleterious dislocations in multicystalline silicon solar cells. We observe that after processing recombination-active dislocations contain a high degree of nanoscale iron and copper decoration, while recombination-inactive dislocations appear clean. To study the origins of the distinct metal decorations around different dislocations we analyze as-grown samples as well as specimens at different stages of processing. We complement our X-ray studies with micro-Raman mapping to understand the relationship between metallic decoration and stress fields around dislocations.

Original language	English (US)
Title of host publication	Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages	1613-1616
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2012.6317904
State	Published - 2012
Event	38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States Duration: Jun 3 2012 → Jun 8 2012

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Country/Territory	United States
City	Austin, TX
Period	6/3/12 → 6/8/12

Keywords

X-ray fluorescence
dislocations
micro-Raman
silicon solar cells

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2012.6317904

Cite this

Bertoni, M., Sarau, G., Fenning, D. P., Rinio, M., Rose, V., Maser, J., & Buonassisi, T. (2012). Nano-XRF and micro-raman studies of metal impurity decoration around dislocations in multicrystalline silicon. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 (pp. 1613-1616). Article 6317904 (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6317904

Nano-XRF and micro-raman studies of metal impurity decoration around dislocations in multicrystalline silicon. / Bertoni, Mariana; Sarau, G.; Fenning, D. P. et al.
Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 1613-1616 6317904 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Bertoni, M, Sarau, G, Fenning, DP, Rinio, M, Rose, V, Maser, J & Buonassisi, T 2012, Nano-XRF and micro-raman studies of metal impurity decoration around dislocations in multicrystalline silicon. in Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012., 6317904, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1613-1616, 38th IEEE Photovoltaic Specialists Conference, PVSC 2012, Austin, TX, United States, 6/3/12. https://doi.org/10.1109/PVSC.2012.6317904

Bertoni M, Sarau G, Fenning DP, Rinio M, Rose V, Maser J et al. Nano-XRF and micro-raman studies of metal impurity decoration around dislocations in multicrystalline silicon. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 1613-1616. 6317904. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2012.6317904

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abstract = "We push the resolution limits of synchrotron-based nano-X-ray fluorescence mapping below 100 nm to investigate the fundamental differences between benign and deleterious dislocations in multicystalline silicon solar cells. We observe that after processing recombination-active dislocations contain a high degree of nanoscale iron and copper decoration, while recombination-inactive dislocations appear clean. To study the origins of the distinct metal decorations around different dislocations we analyze as-grown samples as well as specimens at different stages of processing. We complement our X-ray studies with micro-Raman mapping to understand the relationship between metallic decoration and stress fields around dislocations.",

keywords = "X-ray fluorescence, dislocations, micro-Raman, silicon solar cells",

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AU - Bertoni, Mariana

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AU - Rose, V.

AU - Maser, J.

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AB - We push the resolution limits of synchrotron-based nano-X-ray fluorescence mapping below 100 nm to investigate the fundamental differences between benign and deleterious dislocations in multicystalline silicon solar cells. We observe that after processing recombination-active dislocations contain a high degree of nanoscale iron and copper decoration, while recombination-inactive dislocations appear clean. To study the origins of the distinct metal decorations around different dislocations we analyze as-grown samples as well as specimens at different stages of processing. We complement our X-ray studies with micro-Raman mapping to understand the relationship between metallic decoration and stress fields around dislocations.

KW - X-ray fluorescence

KW - dislocations

KW - micro-Raman

KW - silicon solar cells

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Nano-XRF and micro-raman studies of metal impurity decoration around dislocations in multicrystalline silicon

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Keywords

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