Nano-scale Defect Analysis Through K-Means Clustering of CuInSe2 Solar Cells with Ag and K Incorporation

Tara Nietzold; Michael Stuckelberger; Trumann Walker; Nicholas Valdes; Bradley M. West; Barry Lai; William N. Shafarman; Mariana I. Bertoni

doi:10.1109/PVSC40753.2019.8980709

Nano-scale Defect Analysis Through K-Means Clustering of CuInSe₂ Solar Cells with Ag and K Incorporation

Tara Nietzold, Michael Stuckelberger, Trumann Walker, Nicholas Valdes, Bradley M. West, Barry Lai, William N. Shafarman, Mariana I. Bertoni

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Nano-X-ray fluorescence microscopy is used to correlate elemental inhomogeneity to device performance measured through X-ray beam induced current (XBIC). Unsupervised machine learning techniques can be useful in the processing and correlation of XRF/XBIC data. A case study using CuInSe₂ solar cells treated with Ag-alloying and KF-post- deposition treatment (PDT) is presented. The implementation of K-means clustering is studied for its ability to identify statistically meaningful results from XRF/XBIC data. The procedure described may be applied to datasets of a similar nature.

Original language	English (US)
Title of host publication	2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	2164-2166
Number of pages	3
ISBN (Electronic)	9781728104942
DOIs	https://doi.org/10.1109/PVSC40753.2019.8980709
State	Published - Jun 2019
Event	46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States Duration: Jun 16 2019 → Jun 21 2019

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Conference

Conference	46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/Territory	United States
City	Chicago
Period	6/16/19 → 6/21/19

Keywords

CIS
K-means
X-ray beam induced current
X-ray fluorescence
clustering
machine learning

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC40753.2019.8980709

Cite this

Nietzold, T., Stuckelberger, M., Walker, T., Valdes, N., West, B. M., Lai, B., Shafarman, W. N., & Bertoni, M. I. (2019). Nano-scale Defect Analysis Through K-Means Clustering of CuInSe₂ Solar Cells with Ag and K Incorporation. In 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019 (pp. 2164-2166). Article 8980709 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC40753.2019.8980709

Nano-scale Defect Analysis Through K-Means Clustering of CuInSe₂ Solar Cells with Ag and K Incorporation. / Nietzold, Tara; Stuckelberger, Michael; Walker, Trumann et al.
2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 2164-2166 8980709 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Nietzold, T, Stuckelberger, M, Walker, T, Valdes, N, West, BM, Lai, B, Shafarman, WN & Bertoni, MI 2019, Nano-scale Defect Analysis Through K-Means Clustering of CuInSe₂ Solar Cells with Ag and K Incorporation. in 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019., 8980709, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 2164-2166, 46th IEEE Photovoltaic Specialists Conference, PVSC 2019, Chicago, United States, 6/16/19. https://doi.org/10.1109/PVSC40753.2019.8980709

Nietzold T, Stuckelberger M, Walker T, Valdes N, West BM, Lai B et al. Nano-scale Defect Analysis Through K-Means Clustering of CuInSe₂ Solar Cells with Ag and K Incorporation. In 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 2164-2166. 8980709. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC40753.2019.8980709

Nietzold, Tara ; Stuckelberger, Michael ; Walker, Trumann et al. / Nano-scale Defect Analysis Through K-Means Clustering of CuInSe₂ Solar Cells with Ag and K Incorporation. 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 2164-2166 (Conference Record of the IEEE Photovoltaic Specialists Conference).

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abstract = "Nano-X-ray fluorescence microscopy is used to correlate elemental inhomogeneity to device performance measured through X-ray beam induced current (XBIC). Unsupervised machine learning techniques can be useful in the processing and correlation of XRF/XBIC data. A case study using CuInSe2 solar cells treated with Ag-alloying and KF-post- deposition treatment (PDT) is presented. The implementation of K-means clustering is studied for its ability to identify statistically meaningful results from XRF/XBIC data. The procedure described may be applied to datasets of a similar nature.",

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