Multiple elastic scattering of core-loss electrons in atomic resolution imaging

Christian Dwyer, S. D. Findlay, L. J. Allen

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

We consider the elastic scattering of a fast incident electron both prior and subsequent to its involvement in an atomic inner-shell ionization (core-loss) event in a crystal. By using numerical simulations, it is shown that elastic scattering subsequent to ionization can strongly affect the qualitative features of atomic resolution core-loss images of crystals recorded in the scanning transmission electron microscope (STEM). This conclusion holds even for a thin crystal foil and for a relatively large detector, which is matched to the probe-forming aperture in an aberration-corrected STEM. Such a conclusion is potentially very important for the interpretation of experimental core-loss images. We also introduce an approximate model that incorporates the effects of elastic scattering subsequent to ionization in the case of a small detector.

Original languageEnglish (US)
Article number184107
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume77
Issue number18
DOIs
StatePublished - May 9 2008
Externally publishedYes

Fingerprint

Elastic scattering
Multiple scattering
Ionization
elastic scattering
Imaging techniques
ionization
Crystals
Electrons
Electron microscopes
electron microscopes
crystals
Detectors
Scanning
electrons
scanning
detectors
Aberrations
Metal foil
aberration
foils

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Multiple elastic scattering of core-loss electrons in atomic resolution imaging. / Dwyer, Christian; Findlay, S. D.; Allen, L. J.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 77, No. 18, 184107, 09.05.2008.

Research output: Contribution to journalArticle

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